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TEM and STEM Tomography for thick polymer sample

Published online by Cambridge University Press:  26 July 2009

T Kaneko
Affiliation:
JEOl Ltd
S Motoki
Affiliation:
JEOl Ltd
Y Aoyama
Affiliation:
JEOl Ltd
H Nishioka
Affiliation:
JEOl Ltd
Y Ohkura
Affiliation:
JEOl Ltd
Y Kondo
Affiliation:
JEOl Ltd
H Jinnai
Affiliation:
Kyoto Institute of Technology

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2009