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Toward Ultrafast Electron Microscopy

Published online by Cambridge University Press:  01 August 2004

Wayne E. King ,
Geoffrey H. Campbell ,
Alan Frank ,
Bryan Reed ,
John Schmerge ,
Bradley Siwick ,
Brent Stuart  and
Peter Weber
Wayne E. King
Affiliation:
University of California Lawrence Livermore National Laboratory, Livermore, California
Geoffrey H. Campbell
Affiliation:
University of California Lawrence Livermore National Laboratory, Livermore, California
Alan Frank
Affiliation:
University of California Lawrence Livermore National Laboratory, Livermore, California
Bryan Reed
Affiliation:
University of California Lawrence Livermore National Laboratory, Livermore, California
John Schmerge
Affiliation:
Stanford University, Menlo Park, California
Bradley Siwick
Affiliation:
FOM Institute for Atomic and Molecular Physics, Amsterdam, The Netherlands
Brent Stuart
Affiliation:
University of California Lawrence Livermore National Laboratory, Livermore, California
Peter Weber
Affiliation:
Brown University, Providence, Rhode Island
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Extract

Extended abstract of a paper presented at the Pre-Meeting Congress: Materials Research in an Aberration-Free Environment, at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, July 31 and August 1, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S03 , August 2004 , pp. 14 - 15
Copyright
© 2004 Microscopy Society of America

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