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Ultra Low Voltage Reflected Electron Energy Loss Spectroscopy

Published online by Cambridge University Press:  05 August 2019

Yusuke SAKUDA ,
Shunsuke ASAHINA ,
Natasha ERDMAN ,
Takanari TOGASHI ,
Masato KURIHARA  and
Osamu TERASAKI
Yusuke SAKUDA
Affiliation:
JEOL.ltd, 3-1-2 Musashino, Akisima, Tokyo 196-8558JAPAN Yamagata University
Shunsuke ASAHINA*
Affiliation:
JEOL.ltd, 3-1-2 Musashino, Akisima, Tokyo 196-8558JAPAN
Natasha ERDMAN
Affiliation:
JEOL USA Inc.11 Dearborn RD, Peabody, MA, 01960, USA
Takanari TOGASHI
Affiliation:
Yamagata University
Masato KURIHARA
Affiliation:
Yamagata University
Osamu TERASAKI
Affiliation:
ShanghaiTech University
*
*Corresponding author: sasahina@jeol.co.jp

Abstract

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Type
Low Voltage, Low Energy Electron Microscopy Imaging and Analysis
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 442 - 443
Copyright
Copyright © Microscopy Society of America 2019 

References

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[5]Terasaki, O. et al. , JEOL News, 52 (2017)Google Scholar