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Understanding Conditions Affecting Background in Atom Probe Tomography with Implications for Analysis of Hydrogen

Published online by Cambridge University Press:  01 August 2018

Ty J. Prosa
Ty J. Prosa*
Affiliation:
CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI53711USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1028 - 1029
Copyright
© Microscopy Society of America 2018 

References

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[3] Louthan, M.R. JFAP 8 2008) p. 289.Google Scholar
[4] Takahashi, J., et al., Scr. Mater 63 2010) p. 261.Google Scholar
[5] Müller, E.W. Tsong, T.T. Field ion microscopy: principles and applications. American Elsevier Pub. Co. New York 1969.Google Scholar