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Understanding Domain Structures in BiFeO3 Thin Films by Combining Phase-Field Simulations, TEM, and PFM

Published online by Cambridge University Press:  01 August 2010

G Sheng ,
JX Zhang ,
B Winchester ,
PP Wu ,
YL Li ,
CT Nelson ,
HW Jang ,
CM Folkman ,
RJ Zeches  and
MP Chu
...Show all authors
G Sheng
Affiliation:
Pennsylvania State University
JX Zhang
Affiliation:
Pennsylvania State University
B Winchester
Affiliation:
Pennsylvania State University
PP Wu
Affiliation:
Pennsylvania State University
YL Li
Affiliation:
Pennsylvania State University
CT Nelson
Affiliation:
University of Michigan
HW Jang
Affiliation:
University of Wisconsin
CM Folkman
Affiliation:
University of Wisconsin
RJ Zeches
Affiliation:
University of Wisconsin
MP Chu
Affiliation:
University of Wisconsin
SV Kalinin
Affiliation:
Oak Ridge National Laboratory
DG Schlom
Affiliation:
Oak Ridge National Laboratory
R Ramesh
Affiliation:
University of California, Berkeley
C-B Eom
Affiliation:
University of Wisconsin
XQ Pan
Affiliation:
University of Michigan
L-Q Chen
Affiliation:
Pennsylvania State University;

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 318 - 319
Copyright
Copyright © Microscopy Society of America 2010