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Vibrational Spectroscopy of Beam-Sensitive Materials in the Transmission Electron Microscope

Published online by Cambridge University Press:  30 July 2021

Alexander Reifsnyder
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH, USA, Columbus, Ohio, United States
Songwei Zhang
Affiliation:
Department of Chemistry, The Ohio State University, Columbus, OH, USA, United States
Yiying Wu
Affiliation:
Department of Chemistry, The Ohio State University, Columbus, OH, USA, United States
David McComb
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH, USA, COLUMBUS, Ohio, United States

Abstract

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Type
Advanced Imaging and Spectroscopy for Nanoscale Materials Characterization
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Ilett, M. et al. , “Analysis of complex, beam-sensitive materials by transmission electron microscopy and associated techniques,” Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences, vol. 378, no. 2186, p. 20190601, Dec. 2020, doi: 10.1098/rsta.2019.0601.CrossRefGoogle Scholar
Berger, M., “What is a MOF (metal organic framework)?,” 16-Sep-2020. [Online]. Available: https://www.nanowerk.com/mof-metal-organic-framework.php.Google Scholar
Krivanek, O. L. et al. , “Vibrational spectroscopy in the electron microscope,” Nature, vol. 514, no. 7521, pp. 209212, Oct. 2014, doi: 10.1038/nature13870.Google Scholar
Dwyer, C., Aoki, T., Rez, P., Chang, S. L. Y., Lovejoy, T. C., and Krivanek, O. L., “Electron-Beam Mapping of Vibrational Modes with Nanometer Spatial Resolution,” Phys. Rev. Lett., vol. 117, no. 25, p. 256101, Dec. 2016, doi: 10.1103/PhysRevLett.117.256101.Google ScholarPubMed
Krivanek, O. L. et al. , “Progress in ultrahigh energy resolution EELS,” Ultramicroscopy, vol. 203, pp. 6067, Aug. 2019, doi: 10.1016/j.ultramic.2018.12.006.Google Scholar
The authors acknowledge funding from the Center for Emergent Materials at The Ohio State University, an NSF MRSEC (DMR- 2011876)Google Scholar