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Taking Correlative Microscopy to a New Level

Published online by Cambridge University Press:  14 March 2018

Stephen W. Carmichael
Stephen W. Carmichael*
Affiliation:
Mayo Clinic
*
carmichael.stephen@mayo.edu

Extract

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We are all familiar with the concept of correlating an image acquired by light microscopy (LM) with one obtained by transmission electron microscopy (TEM). This allows us to take advantage of the “wide angle” view of LM and the high resolution of TEM. Correlative microscopy has been taken to a new level by Alvin Lin and Cynthia Goh who have designed a clever device. This device allows repetitive correlative microscopy between TEM and atomic force microscopy (AFM).

Type
Research Article
Information
Microscopy Today , Volume 11 , Issue 4 , August 2003 , pp. 3 - 7
Copyright
Copyright © Microscopy Society of America 2003

Footnotes

1

The author gratefully acknowledges Dr. M.Cynthia Goh for reviewing this article.

References

2. Lin, A.C., and M.C. Goh, A novel sample holder allowing atomic force microscopy on transmission electron microscopy grids: Repetitive, direct correlation between AFM and TEM images, J. Microscopy 205: 205-208, 2002.Google Scholar