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Application of scanning electron diffraction in the transmission electron microscope for the characterisation of dislocations in minerals

Published online by Cambridge University Press:  30 July 2018

Billy C. Nzogang ,
Alexandre Mussi  and
Patrick Cordier
Billy C. Nzogang
Affiliation:
Université de Lille, CNRS, INRA, ENSCL, UMR 8207 – UMET – Unité Matériaux et Transformations, F-59000 Lille, France
Alexandre Mussi
Affiliation:
Université de Lille, CNRS, INRA, ENSCL, UMR 8207 – UMET – Unité Matériaux et Transformations, F-59000 Lille, France
Patrick Cordier*
Affiliation:
Université de Lille, CNRS, INRA, ENSCL, UMR 8207 – UMET – Unité Matériaux et Transformations, F-59000 Lille, France
*
*Author for correspondence: Patrick Cordier, Email: patrick.cordier@univ-lille.fr
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Abstract

We present an application of scanning electron diffraction for the characterisation of crystal defects in olivine, quartz and phase A (a high pressure hydrated phase). In this mode, which takes advantage of the ASTAR™ module from NanoMEGAS, a slightly convergent probe is scanned over the sample with a short acquisition time (a few tens of ms) and the spot patterns are acquired and stored for further post-processing. Originally, orientation maps were constructed from automatic indexing at each probe location. Here we present another application where images are reconstructed from the intensity of diffraction spots, producing either so-called ‘virtual’ bright- or dark-field images. We show that these images present all the characteristics of contrast (perfect crystal or defects) of conventional transmission electron microscopy images. Data are acquired with a very short time per probe location (a few tens of milliseconds), this technique appears very attractive for the characterisation of beam-sensitive materials. However, as the acquisition is done at a given orientation, fine tuning of the diffraction conditions at a given location for each reflection is not possible. This might present a difficulty for some precise, quantitative contrast analysis.

Keywords

transmission electron microscopyscanning electron diffractiondislocations
Type
Article
Information
Mineralogical Magazine , Volume 83 , Issue 1 , February 2019 , pp. 71 - 79
Copyright
Copyright © Mineralogical Society of Great Britain and Ireland 2018 

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Footnotes

Associate Editor: Giancarlo Della Ventura

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