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Length Scale Effect on Deformation and Failure Mechanisms of Ultra-Fine Grained Aluminum

Published online by Cambridge University Press:  26 February 2011

Khalid Hattar ,
J H Han ,
D M Follstaedt ,
S J Hearne ,
T A Saif  and
I M Robertson
Khalid Hattar
Affiliation:
hattar@uiuc.edu, University of Illinois, Materials Science, 1304 W. Green St., Urbana, Illinois, 61801, United States, 217-244-6852
J H Han
Affiliation:
jhhan@uiuc.edu, University of Illinois, Mechanical and Industrial Engineering, United States
D M Follstaedt
Affiliation:
dmfolls@sandia.gov, Sandia National Laboratories, United States
S J Hearne
Affiliation:
sjhearn@sandia.gov, Sandia National Laboratories, United States
T A Saif
Affiliation:
saif@uiuc.edu, University of Illinois, Mechanical and Industrial Engineering, United States
I M Robertson
Affiliation:
ianr@uiuc.edu, University of Illinois, Materials Scinece and Engineering, United States
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Abstract

The deformation and failure processes in ultra-fine and nanograined metals over different length scales have been probed using transmission electron microscopy (TEM) and scanning electron microscopy (SEM) in combination with a micromechanical in situ straining device. This novel straining device affords the opportunity to directly correlate the macroscopic mechanical properties with the microscopic deformation and failure mechanisms. Through use of this device it has been shown that increased film thickness results in a transition between limited plasticity and intergranular fracture to global plasticity and shear failure for deposited aluminum samples of similar grain size but different thickness.

Keywords

microelectro-mechanical (MEMS)transmission electron microscopy (TEM)Al
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 907: Symposium MM – In-Situ Electron Microscopy of Materials , 2005 , 0907-MM01-03
Copyright
Copyright © Materials Research Society 2006

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