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Measurements of the Dielectric Properties of Irradiated Low-Loss by Microwave Reflectometry and Micro-Calorimetry

Published online by Cambridge University Press:  28 February 2011

S.N. Buckley  and
P. Agnew
S.N. Buckley
Affiliation:
AEA Technology, Harwell, United Kingdom
P. Agnew
Affiliation:
AEA Technology, Harwell, United Kingdom
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Abstract

An rf reflectometer has been used to measure dielectric losses in alumina ceramics during irradiation by 3 MeV protons. The equipment was able to detect tan ȯ changes of 5×10−5, but calibration by micro-calorimetry revealed large systematic losses, up to 2.5×10−3 Irradiation at 300 K resulted in a progressive increase in dielectric loss but no prompt increments.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 189: Symposium L – Microwave Processing of Materials II , 1990 , 503
Copyright
Copyright © Materials Research Society 1991

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References

REFERENCES

1. Westphal, W.B in Dielectric Materials and Applications, edited by Hippel, A.R. von (John Wiley N.Y., 1954) pp. 63–122.Google Scholar
2. Pells, G.P., Buckley, S.N., Agnew, P., Foreman, A.J.E., Murphy, M.J. and Staunton-Lambert, S.A.B., UKAEA report AERE R 13222 (1988).Google Scholar