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Photoexcitations in Poly(2,5-Thienylene Vinylene)

Published online by Cambridge University Press:  25 February 2011

I. D. W. Samuel ,
A. J. Brassett ,
N. F. Colaneri ,
R. A. Lawrence ,
D. D. C. Bradley ,
K. E. Meyer ,
R. H. Friend ,
H. Murata ,
S. Tokito  and
T. Tsutsui
...Show all authors
I. D. W. Samuel
Affiliation:
Cavendish Laboratory, Madingley Road, Cambridge CB3 OHE, UK.
A. J. Brassett
Affiliation:
Cavendish Laboratory, Madingley Road, Cambridge CB3 OHE, UK.
N. F. Colaneri
Affiliation:
Cavendish Laboratory, Madingley Road, Cambridge CB3 OHE, UK.
R. A. Lawrence
Affiliation:
Cavendish Laboratory, Madingley Road, Cambridge CB3 OHE, UK.
D. D. C. Bradley
Affiliation:
Cavendish Laboratory, Madingley Road, Cambridge CB3 OHE, UK.
K. E. Meyer
Affiliation:
Cavendish Laboratory, Madingley Road, Cambridge CB3 OHE, UK.
R. H. Friend
Affiliation:
Cavendish Laboratory, Madingley Road, Cambridge CB3 OHE, UK.
H. Murata
Affiliation:
Department of Materials Science and Technology, Graduate School of Engineering Sciences, Kyushu University, Kasuga, Fukuoka, 816 Japan
S. Tokito
Affiliation:
Department of Materials Science and Technology, Graduate School of Engineering Sciences, Kyushu University, Kasuga, Fukuoka, 816 Japan
T. Tsutsui
Affiliation:
Department of Materials Science and Technology, Graduate School of Engineering Sciences, Kyushu University, Kasuga, Fukuoka, 816 Japan
S. Saito
Affiliation:
Department of Materials Science and Technology, Graduate School of Engineering Sciences, Kyushu University, Kasuga, Fukuoka, 816 Japan
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Abstract

Poly(2,5-thienylene vinylene), PTV, can be conveniently prepared via a precursor route to give coherent films suitable for optical measurements. Photoexcitation above the band gap at 1.8 eV gives rise to two transient absorption peaks at 0.44 eV and 1.0 eV that are associated with bipolarons that live for times of order a few ms at 80 K. Photoluminescence, comparable in intensity to the Raman scattering, is found at energies above the band edge, and we assign this to a hot recombination process. Pump and probe measurements of the induced bleaching at 2 eV show a very fast rise and initial fall time, which are within the 100 fsec resolution of the measurement.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 173: Symposium Q – Advanced Organic Solid State Materials , 1989 , 637
Copyright
Copyright © Materials Research Society 1990

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References

REFERENCES

1. Fesser, K., Bishop, A.R., Campbell, D.K., Phys.Rev.B 27, 4804 (1983).CrossRefGoogle Scholar
2. Brazovskii, S. and Kirova, K., JETP Lett. 33,4 (1981).Google Scholar
3. Heeger, A. J., Kivelson, S., Schrieffer, J. R., Su, W-P., Rev. Mod. Phys. 60, 781 (1988).Google Scholar
4. Friend, R. H., Bradley, D. D. C., Townsend, P. D., J. Phys. D: Appl.Phys. 20, 1367 (1987).Google Scholar
5. Vardeny, Z., Ehrenfreund, E., Brafman, O., Nowak, M., Schaffer, H., Heeger, A. J. and Wudl, F., Phys. Rev. Lett. 56, 671 (1986).Google Scholar
6. Kim, Y. H., Spiegel, D., Hotta, S. and Heeger, A. J., Phys. Rev. B38, 5490 (1988).Google Scholar
7. Rüne, J., Colaneri, N. F., Bradley, D. D. C., Friend, R. H. and Wegner, G. (to be published).Google Scholar
8. Bradley, D. D. C., J. Phys. D: Appl. Phys. 20, 1389 (1987).Google Scholar
9. Yamada, S., Tokito, S., Tsutsui, T., Saito, S., J. Chem. Soc., Chem. Commun. 1448 (1987) .Google Scholar
10. Tokito, S., Momii, T., Murata, H., Tsutsui, T., Saito, S., Polymer (in press).Google Scholar
11. Bradley, D. D. C., Colaneri, N. F., Friend, R. H., Synthetic Metals 29, E121 (1989).Google Scholar
12. Brassett, A. J., Colaneri, N. F., Bradley, D. D. C., Lawrence, R. A., Friend, R. H., Murata, H., Tokito, S., Tsutsui, T. and Saito, S. (preprint).Google Scholar
13. Foster, C.M., Kim, Y. H., Uotani, N. and Heeger, A. J., Synthetic Metals 29, E135 (1989).Google Scholar
14. Orenstein, J., Baker, G. L. and Vardeny, Z., J. Physique Colloq. 44, C3–407 (1983).Google Scholar
15. Colaneri, N. F., Friend, R. H.. Schaffer, H. E. and Heeger, A. J., Phys. Rev. B38, 3960 (1988) .Google Scholar
16. Shank, C. V., Yen, R., Orenstein, J. and Baker, G. L., Phys. Rev. B28, 6095 (1983).CrossRefGoogle Scholar
17. Vardeny, Z., Strait, J., Moses, D., Chung, T-C. and Heeger, A. J., Phys. Rev. Lett. 49, 1657 (1982).CrossRefGoogle Scholar
18. Vardeny, Z., Grahn, H. T., Heeger, A. J. and Wudl, F., Synthetic Metals 28, C299 (1989).Google Scholar
19. Greene, B. I.,Orenstein, J., Millard, R. R. and Williams, L. R., Phys. Rev. Lett. 58, 2750 (1987).Google Scholar