Hostname: page-component-848d4c4894-pftt2 Total loading time: 0 Render date: 2024-05-23T13:19:49.206Z Has data issue: false hasContentIssue false
  • English
  • Français

Basic Aspects of X-Ray Absorption In Quantitative Diffraction Analysis of Powder Mixtures*

Published online by Cambridge University Press:  10 January 2013

Leroy Alexander  and
Harold P. Klug
Leroy Alexander
Affiliation:
Mellon Institute, Pittsburgh 13, Pa., U.S.A.
Harold P. Klug
Affiliation:
Mellon Institute, Pittsburgh 13, Pa., U.S.A.
Get access Rights & Permissions [Opens in a new window]

Abstract

The mathematical relationships are developed which are pertinent to the quantitative analysis of powder mixtures for the case of diffraction from the surface of a flat powder specimen. These formulas relate the diffracted intensity to the absorptive properties of the sample. Three important cases are treated: (1) Mixture of n components; absorbing powder of the unknown equal to that of the matrix; concentration proportional to intensity. Direct analysis is permitted. (2) Binary mixture; absorbing powder of the unknown not equal to that of the diluent; concentration not proportional to intensity. Direct analysis is possible by means of calibration curves prepared from synthetic mixtures. (3) Mixture of n components; absorbing power of the unknown not equal to that of the matrix; general case. Analysis is accomplished by the addition of an internal standard. Concentration is proportional to the ratio of the intensity of a selected reflection from the unknown to the intensity of a reflection from the internal standard.

Type
Research Article
Information
Powder Diffraction , Volume 4 , Issue 2 , June 1989 , pp. 66 - 69
Copyright
Copyright © Cambridge University Press 1989

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

(1)Ballard, J.W., Oshry, H.I., and Schrenk, H.H., J. Optical Soc. Am., 33, 667–75 (1943).CrossRefGoogle Scholar
(2)Ballard, J.W., Oshry, H.I., and Schrenk, H.H., U.S. Bur. Mines, Rept. Invest. 3520 June 1940).Google Scholar
(3)Ballard, J.W., and Schrenk, H.H., U.S. Bur. Mines, Rept. Invest., 3888 (June 1946).Google Scholar
(4)Brentano, J.C.M., Phil. Mag., 6, 178–91 (1928).CrossRefGoogle Scholar
(5)Brentano, J.C.M., Proc. Phys. Soc., 47, 932–47 (1935).CrossRefGoogle Scholar
(6)Brindley, G.W., Phil. Mag., 6, 347–69 (1945).CrossRefGoogle Scholar
(7)Clark, G.L., and Reynolds, D.H., Ind. Eng. Chem., Anal. Ed., 8, 36–40 (1936),Google Scholar
(8)Glocker, R., Metallwirtsch., 12, 599–602 (1933).Google Scholar
(9)Gross, S.T., and Martin, D.E., Ind. Eng. Chem., Anal. Ed., 16, 95–8 (1944).Google Scholar
(10)Schäfer, K., Z. Krist., 99, 142–52 (1938).Google Scholar
(11)Scheibe, G., “Chemische Spektralanalyse, physikalische Methoden der anlytischen Chemie,” Vol. I, p. 108, Leipzig, Akademische Verlagsgesellschaft, 1933.Google Scholar
(12)Taylor, A., Phil. Mag., 35, 632–9 (1944).CrossRefGoogle Scholar