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D121 Structure Investigations of Thin Films and Lateral Nanostructures by Means of X-ray Grazing Incidence Diffraction - Invited

Published online by Cambridge University Press:  20 May 2016

J. Grenzer  and
U. Pietsch
J. Grenzer
Affiliation:
University of Potsdam, Potsdam, Germany
U. Pietsch
Affiliation:
University of Potsdam, Potsdam, Germany
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Abstract

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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 18 , Issue 2 , June 2003 , pp. 173
Copyright
Copyright © Cambridge University Press 2003

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