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F-64 Expanding the Detector Efficiency of Silicon Drift Detectors with Optimized Radiation Entrance Window

Published online by Cambridge University Press:  20 May 2016

A. Niculae ,
H. Soltau ,
G. Lutz ,
P. Lechner ,
A. Bechteler ,
R. Eckhardt ,
K. Hermenau ,
O. Jaritschin ,
A. Liebel  and
A. Simsek
...Show all authors
A. Niculae
Affiliation:
PNSensor GmbH, Munich, Germany
H. Soltau
Affiliation:
PNSensor GmbH, Munich, Germany
G. Lutz
Affiliation:
PNSensor GmbH, Munich, Germany
P. Lechner
Affiliation:
PNSensor GmbH, Munich, Germany
A. Bechteler
Affiliation:
PNSensor GmbH, Munich, Germany
R. Eckhardt
Affiliation:
PNSensor GmbH, Munich, Germany
K. Hermenau
Affiliation:
PNSensor GmbH, Munich, Germany
O. Jaritschin
Affiliation:
PNDetector GmbH, Munich, Germany
A. Liebel
Affiliation:
PNDetector GmbH, Munich, Germany
A. Simsek
Affiliation:
PNDetector GmbH, Munich, Germany
G. Schaller
Affiliation:
MPI Semiconductor Laboratory, Munich, Germany
F. Schopper
Affiliation:
MPI Semiconductor Laboratory, Munich, Germany
L. Strüder
Affiliation:
MPI Semiconductor Laboratory, Munich, Germany
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Abstract

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Type
DENVER X-RAY CONFERENCE
Information
Powder Diffraction , Volume 23 , Issue 2 , June 2008 , pp. 173
Copyright
Copyright © Cambridge University Press 2008

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