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Powder X-ray diffraction study of synthetic PdSn

Published online by Cambridge University Press:  01 March 2012

František Laufek ,
Anna Vymazalová ,
František Laufek  and
Jakub Plášil
František Laufek
Affiliation:
Czech Geological Survey, Geologická 6, 152 00 Prague 5, Czech Republic
Anna Vymazalová
Affiliation:
Czech Geological Survey, Geologická 6, 152 00 Prague 5, Czech Republic
František Laufek
Affiliation:
Faculty of Science, Charles University, Albertov 6, 128 43 Praha 2, Czech Republic
Jakub Plášil
Affiliation:
Faculty of Science, Charles University, Albertov 6, 128 43 Praha 2, Czech Republic
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Abstract

Improved X-ray powder diffraction data for synthetic PdSn are reported. Powder diffraction data were collected with a laboratory X-ray source (CuKα) for Rietveld refinement. Refined crystallographic data for PdSn (orthorhombic, Pnma) are a=6.1388(4), b=3.89226(3), c=6.3377(4) Å, V=151.43(2) Å3, Z=4, and Dx=9.87 g∕cm3.

Keywords

PdSnpowder diffraction dataRietveld refinement
Type
Technical Articles
Information
Powder Diffraction , Volume 21 , Issue 4 , December 2006 , pp. 307 - 309
Copyright
Copyright © Cambridge University Press 2006

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