Hostname: page-component-848d4c4894-x5gtn Total loading time: 0 Render date: 2024-06-07T05:25:18.163Z Has data issue: false hasContentIssue false
  • English
  • Français

Quantitative Phase Analysis By Linear Regression of Chemistry on X-Ray Diffraction Intensity

Published online by Cambridge University Press:  10 January 2013

Jacques Renault
Jacques Renault
Affiliation:
New Mexico Bureau of Mines and Mineral Resources, Campus Station, Socorro, New Mexico 87801
Get access Rights & Permissions [Opens in a new window]

Abstract

XRF and XRD measurements made on a single pressed powder briquet can be combined to give more quantitative information than either technique employed alone. Speed of analysis and simplification of sample preparation are also enhanced. The algorithm presented here uses multiple linear regression of the concentrations of one or more elements on the corrected X-ray diffraction intensities of the phases containing them. The data reduction program runs on a microcomputer. Data are presented to show its application to mineralogical analysis of artificial mixtures of quartz, microcline (a feldspar) and calcite.

Type
Research Article
Information
Powder Diffraction , Volume 2 , Issue 2 , June 1987 , pp. 96 - 98
Copyright
Copyright © Cambridge University Press 1987

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Criss, J. W. (1980). Adv. X-ray Anal., 23, 93–97.Google Scholar
Fang, J. H. and Zevin, L. (1985). J. of Sediment. Petrol., 55, 611–613.CrossRefGoogle Scholar
Garbauskas, M. F. and Goehner, R. P. (1982). Adv. X-ray Anal., 25, 83–288.Google Scholar
Klug, H. P. and Alexander, L. E. (1974). X-ray Demotion Procedures for Crystalline and Amorphous Materials. 2nd Ed., 534. New York: Wiley Interscience.Google Scholar
Renault, J. (1984). Rev. of Sci. Instr., 55, 805–806.CrossRefGoogle Scholar