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Evidence of strain induced structural change in hetero-epitaxial NdNiO3 thin films with metal-insulator transition

Published online by Cambridge University Press:  02 December 2003

P. Laffez ,
O. I. Lebedev ,
P. Ruello ,
R. Desfeux ,
G. Banerjee  and
F. Capon
P. Laffez*
Affiliation:
Laboratoire de Physique de l'État Condensé, UMR CNRS 6087, Université du Maine, avenue O. Messiaen, 72085 Le Mans Cedex, France
O. I. Lebedev
Affiliation:
EMAT, University of Antwerp, Groeonenborgerlaan 171, 2020 Antwerp, Belgium
P. Ruello
Affiliation:
Laboratoire de Physique de l'État Condensé, UMR CNRS 6087, Université du Maine, avenue O. Messiaen, 72085 Le Mans Cedex, France
R. Desfeux
Affiliation:
Laboratoire de Physico-Chimie des Interfaces et Applications, Université d'Artois, rue Jean Souvraz, SP 18, 62307 Lens Cedex, France
G. Banerjee
Affiliation:
Exp. Cond. Matter Physics Division, Saha Institute of Nuclear Physics 1/AF Bidhan Nagar, Calcutta 700064, India
F. Capon
Affiliation:
Laboratoire de Physique de l'État Condensé, UMR CNRS 6087, Université du Maine, avenue O. Messiaen, 72085 Le Mans Cedex, France
*
patrick.laffez@univ-lemans.fr
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Abstract

Neodymium nickelate thin films have been prepared on NdGaO3 substrates by RF magnetron sputtering and post-annealing treatment under oxygen pressure. Transport properties are found to depend strongly on film thickness. Thick films show transport properties close to bulk ceramics, while very thin films exhibit a large transition from metal to insulator which occurs over a wide temperature range with high resistivity. Structure and surface morphology of the films have been investigated by Transmission Electron Microscopy (TEM) and Atomic Force Microscopy (AFM). Thin films (≈17 nm) grow heteroepitaxially, while thicker films (≈73 nm) show a granular structure. The thinnest sample suggests a symmetry change induced by the epitaxial strain of the substrate. This paper discusses the relationship between microstructure and transport properties.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 25 , Issue 1 , January 2004 , pp. 25 - 31
Copyright
© EDP Sciences, 2004

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References

Lacorre, P., Torrance, J.B., Pannetier, J., Nazzal, A.I., Wang, P.W., Huang, T., J. Solid State Chem. 91, 225 (1991) CrossRef
DeNatale, J.F., Kobrin, P.H., Mater. Res. Soc. Symp. Proc. 479, 145 (1997) CrossRef
Capon, F., Laffez, P., Bardeau, J.-F., Simon, P., Lacorre, P., Appl. Phys. Lett. 81-4, 619 (2002) CrossRef
Zaanen, J., Sawatzky, G.A., Allen, J.W., Phys. Rev. Lett. 55, 418 (1985) CrossRef
Torrance, J.B., Lacorre, P., Nazzal, A.I., Ansaldo, E.J., Niedermayer, Ch., Phys. Rev. B 45, 8209 (1992) CrossRef
Zaghrioui, M., Bulou, A., Lacorre, P., Laffez, P., Phys. Rev. B 63, 1534 (2001)
Frand, G., Bohnke, O., Lacorre, P., Fourquet, J.L., Carré, A., Eid, B., Théobald, J.G., Gire, A., J. Solid State Chem. 120, 157 (1995) CrossRef
Obradors, X., Paulius, L.M., Maple, M.B., Torrance, J.B., Nazzal, A.I., Fontcuberta, J., Granados, X., Phys. Rev. B 7, 12353 (1993) CrossRef
Laffez, P., Retoux, R., Boullay, P., Zaghrioui, M., Lacorre, P., Vantendeloo, G., Eur. Phys. J. Appl. Phys. 12, 55 (2000) CrossRef
Catalan, G., Bowman, R.M., Gregg, J.M., Phys. Rev. B 62, 7892 (2000) CrossRef
Medarde, M.L., J. Phys.-Cond. 9, 1679 (1997)
Goudeau, P., Laffez, P., Zaghrioui, M., Elkaim, P.E., Ruello, P., Cryst. Eng. 5, 317 (2002) CrossRef
Desfeux, R., Da Costa, A., Prellier, W., Surf. Sci. 497, 81 (2002) CrossRef
See for ex. Van Tendeloo, G., Lebedev, O.I., Amelinckx, S., J. Magn. Magn. Mater. 211, 73 (2000) CrossRef