Hostname: page-component-848d4c4894-nr4z6 Total loading time: 0 Render date: 2024-06-04T19:23:50.732Z Has data issue: false hasContentIssue false
  • English
  • Français

Surface plasmon resonance enhancement of the magneto-optical Kerr effect in Cu/Co/Ag/SnO2 structure

Published online by Cambridge University Press:  10 October 2014

Majid Ghanaatshoar ,
Mehrdad Moradi  and
Parsis Tohidi
Majid Ghanaatshoar
Affiliation:
Laser and Plasma Research Institute, Shahid Beheshti University, G.C., Evin, 1983969411 Tehran, Iran Solar Cells Research Group, Shahid Beheshti University, G.C., Evin, 1983969411 Tehran, Iran
Mehrdad Moradi*
Affiliation:
Institute of Nanoscience and Nanotechnology, University of Kashan, 8731751167 Kashan, Iran
Parsis Tohidi
Affiliation:
Laser and Plasma Research Institute, Shahid Beheshti University, G.C., Evin, 1983969411 Tehran, Iran
*
ae-mail: m.moradi@kashanu.ac.ir
Get access

Abstract

In this paper, an Ag ultra thin layer was deposited on the Cu/Co film by thermal evaporation technique in the vacuum. The atomic force microscopy confirms that nanoparticles of Ag were formed on the Co magnetic layer, and subsequently, the longitudinal Kerr signal of Cu/Co/Ag was amplified more than 2 times. This enhancement is resulting from the overlap of the surface plasmon resonance in the silver with the electronic transition in the Co layer. Furthermore, we investigated the effect of transparent semiconductor SnO2 as a cap layer on the magnitude of longitudinal Kerr signal. To obtain the optimal thickness of cap layer, a numerical analysis was carried out using a 4 × 4 characteristic matrix, which takes into account multiple reflections from interfaces within the medium and light transmission through the layers.

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 68 , Issue 1 , October 2014 , 10402
Copyright
© EDP Sciences, 2014

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Chan, G.H., Zhao, J., Hicks, E.M., Schatz, G.C., Van Duyne, R.P., Nano Lett. 7, 1947 (2007)CrossRef
Haes, A.J., Van Duyne, R.P., J. Am. Chem. Soc. 124, 10596 (2002)CrossRef
Elghanian, R., Storhoff, J.J., Mucic, R.C., Letsinger, R.L., Mirkin, C.A., Science 277, 1078 (1997)CrossRef
Sonnichsen, C., Reinhard, B.M., Liphardt, J., Alivisatos, A.P., Nat. Biotechnol. 23, 741 (2005)CrossRef
Jain, P.K., Xiao, Y., Walsworth, R., Cohen, A.E., Nano Lett. 9, 1644 (2009)CrossRef
Zamani, M., Ghanaatshoar, M., Opt. Express 20, 24524 (2012)CrossRef
Qureshi, N., Schmidt, H., Hawkins, A.R., Appl. Phys. Lett. 85, 431 (2004)CrossRef
Kravets, V.G., Lapchuk, A.S., Appl. Opt. 49, 5013 (2010)CrossRef
Clavero, C., Yang, K., Skuza, J.R., Lukaszew, R.A., Opt. Express 18, 7743 (2010)CrossRef
Li, X.F., Bao, J., Zhang, J., Chen, G., Gao, C., Meas. Sci. Technol. 18, 2039 (2007)CrossRef
Moradi, M., Ghanaatshoar, M., Eur. Phys. J. Appl. Phys. 61, 10603 (2013)CrossRef
Zhang, Y.P., Yan, S.-S., Liu, Y.-H., Ren, M.-J., Fang, Y., Chen, Y.X., Liu, G.L., Mei, L.M., Liu, J.P., Qiu, J.H., Wang, S.Y., Chen, L.Y., Appl. Phys. Lett. 89, 42501 (2006)CrossRef
Armelles, G., Gonzalez-Diaz, J.B., Garcia-Martin, A., Garcia-Martin, J.M., Cebollada, A., Gonzalez, M.U., Acimovic, S., Cesario, J., Quidant, R., Badenes, G., Opt. Express 16, 16104 (2008)CrossRef
Regatos, D., Faria, D., Calle, A., Cebollada, A., Seplveda, A., Armelles, G., Lechuga, L.M., J. Appl. Phys. 108, 054502 (2010)CrossRef
De, A., Puri, A., J. Appl. Phys. 91, 9777 (2002)CrossRef
Lang, G.S., Bowen, D., Krafft, C., Mayergoyz, I.D., J. Appl. Phys. 113, 17A929 (2013)CrossRef
Ozaki, S., Kura, H., Maki, H., Sato, T., J. Appl. Phys. 106, 123530 (2009)CrossRef
Zayats, A.V., Smolyaninov, I.I., Maradudin, A.A., Phys. Rep. 408, 131 (2005)CrossRef
Bohren, C.F., Huffman, D.R., Absorption and Scattering of Light by Small Particles (Wiley-VCH Verlag GmbH, Weinheim, Germany, 2007)Google Scholar
Ghanaatshoar, M., Moradi, M., Opt. Eng. 50, 093801 (2011)
Georges, B., Yves, P., Magneto-optical voltage measuring device utilizing polarized light, Patent US 3502978A 1970 Google Scholar
Ferreiro-Vila, E., Sueiro, X.M.B., Gonzalez-Diaz, J.B., Garcia-Martin, A., Garcia-Martin, J.M., Navarro, A.C., Reig, G.A., Rodriguez, D.M., Sandoval, E.M., IEEE Trans. Magn. 44, 3303 (2008)CrossRef
Zhu, M., Qian, G., Ding, G., Wang, Z., Wang, M., Mater. Chem. Phys. 96, 489 (2006)CrossRef
Noguez, C., J. Phys. Chem. C 111, 3806 (2007)CrossRef
Fan, X., Wang, G.P., Opt. Lett. 31, 1322 (2006)CrossRef
Ferreiro-Vila, E., Gonzalez-Diaz, J.B., Fermento, R., Gonzaleznd, M.U., Garcia-Martin, A., Garcia-Martin, J.M., Cebollada, A., Armelles, G., Meneses-Rodriguez, D., Sandoval, E.M., Phys. Rev. B 80, 125132 (2009)CrossRef
Moradi, M., Ghanaatshoar, M., Opt. Commun. 283, 5053 (2010)CrossRef
Ghanaatshoar, M., Moradi, M., Tehranchi, M.M., Hamidi, S.M., J. Non-Cryst. Solids 354, 5266 (2008)CrossRef
Dong, Y., Zhang, X., J. Appl. Phys. 105, 054105 (2009)CrossRef
Bourzami, A., Lenoble, O., Bobo, J.F., Layadi, A., Piecuch, M., Eur. Phys. J. Appl. Phys. 20, 9 (2002)CrossRef
Qiu, Z.Q., Bader, S.D., Rev. Sci. Instrum. 71, 1243 (2000)CrossRef
Visnovsky, V., Liskova-Jakubisova, E., Harward, I., Celinski, Z., Opt. Express 21, 3400 (2013)CrossRef