3 results
Open-hardware, High-vacuum Storage for TEM Holders Remedies and Quantifies Hydrocarbon Contamination
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 3120-3123
- Print publication:
- August 2020
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Contamination of TEM Holders Quantified and Mitigated With the Open-Hardware, High-Vacuum Bakeout System
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue 5 / October 2020
- Published online by Cambridge University Press:
- 14 July 2020, pp. 906-912
- Print publication:
- October 2020
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Exploring Heterogeneity in Li Battery Electrodes using FIB-SEM Integrated with Raman and TOF-SIMS
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 862-863
- Print publication:
- August 2019
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