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Traceable Measurements using a Metrology Scanning Electron Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 3088-3090
- Print publication:
- August 2022
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A Piezoresistive Cantilever Force Sensor for Direct AFM Force Calibration
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1021 / 2007
- Published online by Cambridge University Press:
- 01 February 2011, 1021-HH02-03
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- 2007
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Progress toward Système International d'Unités traceable force metrology for nanomechanics
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- Journal:
- Journal of Materials Research / Volume 19 / Issue 1 / January 2004
- Published online by Cambridge University Press:
- 03 March 2011, pp. 366-379
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- January 2004
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