34 results
Dislocation Analysis in Metal-Oxide Materials and Devices by Electron Channeling Contrast Imaging
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 706-707
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- July 2012
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Holographic Phase Imaging of Charged Threading Dislocation in 4H-SiC
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 564-565
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- July 2010
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Future Prospects for SEM-based Defect Analysis using Fast Electrons
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 608-609
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- July 2010
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Nonlinear model reference adaptive control
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- Journal of the Australian Mathematical Society. Series B. Applied Mathematics / Volume 28 / Issue 2 / October 1986
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- 17 February 2009, pp. 147-157
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Electron Microscopy Study of Localized Gate Forward Breakdown in AlGaN/AlN/GaN High Electron Mobility Transistors
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 624-625
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- August 2008
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Molecular Beam Epitaxial Growth and Dielectric Characterization of Ba0.6Sr0.4TiO3 Films
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- MRS Online Proceedings Library Archive / Volume 966 / 2006
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- 26 February 2011, 0966-T07-23
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- 2006
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Advances in Silicon Carbide Electronics
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- MRS Bulletin / Volume 30 / Issue 4 / April 2005
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- 31 January 2011, pp. 273-278
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- April 2005
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Impact of 2003 Power Outages on Public Health and Emergency Response
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- Prehospital and Disaster Medicine / Volume 20 / Issue 2 / April 2005
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- 28 June 2012, pp. 93-97
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- April 2005
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TEM Observation on Single Defect in SiC
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
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- 01 August 2002, pp. 1180-1181
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- August 2002
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The Effect of Surface Finish on the Dislocation Density in Sublimation grown SiC Layers
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- MRS Online Proceedings Library Archive / Volume 640 / 2000
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- 21 March 2011, H1.3
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- 2000
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Electrical Characterization of a Double Barrier Direct Tunneling Diode Structure
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- MRS Online Proceedings Library Archive / Volume 567 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 247
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- 1999
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Surface Reconstruction during Molecular Beam Epitaxial Growth of GaN (0001)
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- Materials Research Society Internet Journal of Nitride Semiconductor Research / Volume 3 / 1998
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- 13 June 2014, e12
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- 1998
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Schottky Diodes on MOCVD Grown AlGaN Films.
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- Materials Research Society Internet Journal of Nitride Semiconductor Research / Volume 3 / 1998
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- 13 June 2014, e37
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- 1998
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The Structural Evolution Of Lely Seeds During The Initial Stages Of Sic Sublimation Growth
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- MRS Online Proceedings Library Archive / Volume 483 / 1997
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- 10 February 2011, 295
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- 1997
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Scanning tunneling microscopy observation of surface reconstruction of GaN on sapphire and 6H-SiC
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- MRS Online Proceedings Library Archive / Volume 482 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 363
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- 1997
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ICP Dry Etching of III-V Nitrides
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- MRS Online Proceedings Library Archive / Volume 468 / 1997
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- 10 February 2011, 393
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- 1997
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Hrtem Characterization of 6H-15R Polytype Boundaries in Silicon Carbide Grown by Physical Vapor Transport
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- MRS Online Proceedings Library Archive / Volume 442 / 1996
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- 15 February 2011, 655
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- 1996
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Factors Influencing the Electrical and Optical Properties of Aigan Layers on Sapphire
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- MRS Online Proceedings Library Archive / Volume 423 / 1996
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- 15 February 2011, 643
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- 1996
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The Relationship Between Micropipes and Screw Dislocations in Pvt Grown 6H-Sic
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- MRS Online Proceedings Library Archive / Volume 423 / 1996
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- 15 February 2011, 539
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- 1996
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The Influence of Hydrogen Plasma Passivation on Electrical and Optical Properties of Aigan Samples Grown on Sapphire
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- MRS Online Proceedings Library Archive / Volume 423 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 607
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- 1996
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