6 results
Use of Focused Ion Beam as a Sample Preparation Tool for Cryo-Electron Tomography
-
- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 884-885
- Print publication:
- August 2018
-
- Article
-
- You have access
- Export citation
Detection Systems of Ultra-High-Resolution SEMs
-
- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 606-607
- Print publication:
- August 2018
-
- Article
-
- You have access
- Export citation
S9000X - Next Generation of Ultra-High Resolution SEM for Enhanced Analysis and Xe Plasma FIB for Ultra-Fast and Gentle Sputtering
-
- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1116-1117
- Print publication:
- August 2018
-
- Article
-
- You have access
- Export citation
Design of an Ultra-High Resolution SEM for Enhanced Analysis
-
- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 578-579
- Print publication:
- July 2016
-
- Article
-
- You have access
- Export citation
New High-Resolution Low-Voltage and High Performance Analytical FIB/SEM System
-
- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1104-1105
- Print publication:
- August 2014
-
- Article
-
- You have access
- Export citation
FIB-SEM Instrument with Integrated Raman Spectroscopy for Correlative Microscopy
-
- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 990-991
- Print publication:
- August 2014
-
- Article
-
- You have access
- Export citation