6 results
3D Atom Probe for Nano-scale Chemical Analysis
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 60-61
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- July 2010
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Review of Atom Probe Tomography Applications for Semiconductor materials
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 262-263
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- July 2009
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LA-WATAP and SIMS as Complementary Techniques for Quantitative Measurement of Nnanometer Structures
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1242-1243
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- August 2008
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Use of Multilayer Gratings to Improve the X-ray Spectral Analysis at Low Photon Energy
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 162-163
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- August 2007
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MONOX: a characterization tool for the X-UV range
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- Journal:
- The European Physical Journal - Applied Physics / Volume 31 / Issue 2 / August 2005
- Published online by Cambridge University Press:
- 18 August 2005, pp. 147-152
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- August 2005
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The X-ray Analysis at High Spectral Resolution
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 1274-1275
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- August 2005
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