11 results
Simple Method to Determine the Rotation Between a TEM Image and Diffraction Pattern
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 782-783
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- August 2022
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Comparison of convergent beam electron diffraction and annular bright field atomic imaging for GaN polarity determination
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- Journal:
- Journal of Materials Research / Volume 32 / Issue 5 / 14 March 2017
- Published online by Cambridge University Press:
- 13 December 2016, pp. 936-946
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- 14 March 2017
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Application of High Speed Cameras for 4D Data Collection in S/TEM
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 254-255
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- July 2016
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Correlation of Electron Diffraction between t-EBSD in the SEM, CBED in the TEM and ACOM using ASTAR in the TEM using GaN Nanowires
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1249-1250
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- August 2015
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Transmission EBSD in the Scanning Electron Microscope
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- Journal:
- Microscopy Today / Volume 21 / Issue 3 / May 2013
- Published online by Cambridge University Press:
- 01 May 2013, pp. 16-20
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- May 2013
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Tunable glass reference materials for quantitative backscattered electron imaging of mineralized tissues
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- Journal of Materials Research / Volume 27 / Issue 19 / 14 October 2012
- Published online by Cambridge University Press:
- 21 August 2012, pp. 2568-2577
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- 14 October 2012
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Electron Microscope Study of Strain in InGaN Quantum Wells in GaN Nanowires
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1184 / 2009
- Published online by Cambridge University Press:
- 31 January 2011, 1184-HH01-08
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- 2009
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Study of Fatigue Behavior of 300 nm Damascene Interconnect Using High Amplitude AC Tests*
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- MRS Online Proceedings Library Archive / Volume 990 / 2007
- Published online by Cambridge University Press:
- 01 February 2011, 0990-B09-09
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- 2007
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Size-Related Plasticity Effects in AFM Silicon Cantilever Tips*
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- MRS Online Proceedings Library Archive / Volume 924 / 2006
- Published online by Cambridge University Press:
- 01 February 2011, 0924-Z03-02
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- 2006
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Elastodynamic Characterization of Imprinted Nanolines
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- Journal:
- MRS Online Proceedings Library Archive / Volume 924 / 2006
- Published online by Cambridge University Press:
- 01 February 2011, 0924-Z08-31
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- 2006
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Microstructure Evolution During Electric Current Induced Thermomechanical Fatigue of Interconnects
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- Journal:
- MRS Online Proceedings Library Archive / Volume 863 / 2005
- Published online by Cambridge University Press:
- 01 February 2011, B9.5
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- 2005
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