13 results
Damage-less Chemical State Analysis by Using Soft X-ray Emission Spectroscopy in Low Voltage SEM
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1842-1843
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- July 2017
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Low Voltage Soft X-ray Emission Analysis from 100V for Depth Chemical Information from a few nm to several hundred nm
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 422-423
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- July 2016
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Trace Element Analysis under 100 ppm and Chemical State Analysis in Small Area using Wavelength Dispersive Soft X-ray Emission Spectrometer in FE-SEM
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1635-1636
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- August 2015
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Ultra High Solid Angle EDS System Advanced STEM Analysis for FE-SEM
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
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- 27 August 2014, pp. 638-639
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- August 2014
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Recent Achievements of Electron Beam Deceleration Method for FE-SEM Enhanced Elemental Analysis including Soft X-ray Emission Spectroscopy
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 686-687
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- August 2014
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Characterization of Fine Surface Structure with a New Electron Detection System in FE-SEM
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 932-933
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- July 2012
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New Methods for Cross-Section Sample Preparation Using Broad Argon Ion Beam
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1518-1519
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- August 2007
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Coating of Ti-6Al-4V alloy substrates with TiN/Ti multi-layered films by magnetron sputtering*
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- The European Physical Journal - Applied Physics / Volume 38 / Issue 1 / April 2007
- Published online by Cambridge University Press:
- 14 March 2007, pp. 69-72
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- April 2007
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Surface Preparation of Cross Sections of Traditional and Modern Paint Using the Argon Ion Milling Polishing CP System
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1322-1323
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- August 2006
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A High Quality EBSD Pattern from a Steel Cord Prepared with Cross Section Polisher: A Newly Developed Cross-sectioning Apparatus
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1320-1321
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- August 2006
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New Method of Preparing Cross Sectional Samples and Ultra-Thin Foils for SEM and TEM by a Broad Argon Ion Beam
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1246-1247
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- August 2006
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Precise SEM Cross Section Polishing via Argon Beam Milling
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- Microscopy Today / Volume 14 / Issue 3 / May 2006
- Published online by Cambridge University Press:
- 14 March 2018, pp. 22-25
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- May 2006
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Effect of HF in LiPF6 Based Electrolytes on the Properties of Surface Passivation Films Formed on Graphite Electrodes in Li Secondary Batteries
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- Journal:
- MRS Online Proceedings Library Archive / Volume 496 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 457
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- 1997
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