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Ta/Cu1−x Ndx/NiFe/Ta Layers Characterized Using TEM/Microanalysis Techniques
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 756-757
- Print publication:
- August 2019
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- Article
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