Testing of Digital Systems
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Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide-ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through every key area, including detailed treatment of the latest techniques such as system-on-a-chip and IDDQ testing. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.Read more
- Most comprehensive book yet on digital systems testing
- Covers all the latest techniques
- Includes System-on-a-Chip testing
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- Date Published: February 2005
- format: Adobe eBook Reader
- isbn: 9780511074622
- contains: 90 tables
- availability: This ISBN is for an eBook version which is distributed on our behalf by a third party.
Table of Contents
2. Fault models
3. Combinational logic and fault simulation
4. Test generation for combinational circuits
5. Sequential ATPG
6. IDDQ testing
7. Functional testing
8. Delay fault testing
9. CMOS testing
10. Fault diagnosis
11. Design for testability
12. Built-in self-test
13. Synthesis for testability
14. Memory testing
15. High-level test synthesis
16. System-on-a-chip testing
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