Nonlinear Transistor Model Parameter Extraction Techniques
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- Matthias Rudolph, Brandenburg University of Technology
- Christian Fager, Chalmers University of Technology, Gothenberg
- David E. Root, Agilent Technologies, Santa Rosa
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Achieve accurate and reliable parameter extraction using this complete survey of state-of-the-art techniques and methods. A team of experts from industry and academia provides you with insights into a range of key topics, including parasitics, intrinsic extraction, statistics, extraction uncertainty, nonlinear and DC parameters, self-heating and traps, noise, and package effects. Learn how similar approaches to parameter extraction can be applied to different technologies. A variety of real-world industrial examples and measurement results show you how the theories and methods presented can be used in practice. Whether you use transistor models for evaluation of device processing and you need to understand the methods behind the models you use, or you want to develop models for existing and new device types, this is your complete guide to parameter extraction.Read more
- Provides a complete survey of state-of-the-art techniques and methods for accurate and reliable parameter extraction
- Provides real-world examples and insights from a team of experts from industry and academia
- Shows how similar approaches can be applied to different technologies, rather than focusing on just one specific technology
Reviews & endorsements
"Modeling is at the heart of any modern design process and improvements in transistor modeling have made a significant, but often unrecognized, contribution to the wireless revolution impacting our daily lives. The authors and contributors have collaborated across academic and company boundaries to bring together the latest techniques in a comprehensive and practical review of transistor modeling. This book is destined to become the 'go to' reference on the subject." Mark Pierpoint, Agilent TechnologiesSee more reviews
"Without accurate component models, even the most powerful circuit simulator cannot provide meaningful results. The old saying, 'Junk in-Junk out,' summarizes the process. The textbook, Nonlinear Transistor Model Parameter Extraction Techniques, contains a wealth of theoretical and practical information. It should be read by every active RF/Microwave circuit and as well as device designer." Les Besser, Author of COMPACT and Founder of Besser Associates
"Nonlinear Transistor Model Parameter Extraction Techniques is an excellent book that covers this extremely important topic very well...the editors have done a thorough job in putting together a complete summary of the important issues in this area. For a range of device technologies, the main themes that need to be addressed including measurement, extraction, DC and non-linear modelling, noise modelling, thermal issues and package modelling are covered in a clear but detailed manner, by experts in each area. I would highly recommend this title." John Atherton, WIN Semiconductors
"..a very nice guide to how the critical issues of model parameter of extraction are being solved right now and so it is a great resource for designers and modeling groups." - Alfy Riddle, IEEE Microwave Magazine, July/August 2012
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- Date Published: November 2011
- format: Adobe eBook Reader
- isbn: 9781139153669
- contains: 273 b/w illus. 10 tables
- availability: This ISBN is for an eBook version which is distributed on our behalf by a third party.
Table of Contents
1. Introduction M. Rudolph
2. DC and thermal modeling: III-V FETs and HBTs M. Iwamoto, J. Xu and D. E. Root
3. Extrinsic parameter and parasitic elements in III-V HBT and HEMT modeling S. R. Nedeljkovic, W. J. Clausen, F. Kharabi, J. R. F. McMacken and J. M. Gering
4. Uncertainties in small-signal equivalent circuit modeling C. Fager, K. Andersson and M. Ferndahl
5. The large-signal model: theoretical foundations, practical considerations, and recent trends D. E. Root, J. Horn, J. Xu and M. Iwamoto
6. Large and packaged transistors J. Engelmann, F.-J. Schmückle and M. Rudolph
7. Characterization and modeling of dispersive effects O. Jardel, R. Sommet, J.-P. Teyssier and R. Quéré
8. Optimizing microwave measurements for model construction and validation D. Schreurs, M. Myslinski and G. Crupi
9. Practical statistical simulation for efficient circuit design P. Zampardi, Y. Yang, J. Hu, B. Li, M. Fredriksson, K. Kwok and H. Shao
10. Noise modeling M. Berroth.
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