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X-Parameters
Characterization, Modeling, and Design of Nonlinear RF and Microwave Components

$92.00 ( ) USD

Part of The Cambridge RF and Microwave Engineering Series

  • Date Published: No date available
  • availability: This ISBN is for an eBook version which is distributed on our behalf by a third party.
  • format: Adobe eBook Reader
  • isbn: 9781107495869

$ 92.00 USD ( )
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About the Authors
  • This is the definitive guide to X-parameters, written by the original inventors and developers of this powerful new paradigm for nonlinear RF and microwave components and systems. Learn how to use X-parameters to overcome intricate problems in nonlinear RF and microwave engineering. The general theory behind X-parameters is carefully and intuitively introduced, and then simplified down to specific, practical cases, providing you with useful approximations that will greatly reduce the complexity of measuring, modeling and designing for nonlinear regimes of operation. Containing real-world case studies, definitions of standard symbols and notation, detailed derivations within the appendices, and exercises with solutions, this is the definitive stand-alone reference for researchers, engineers, scientists and students looking to remain on the cutting-edge of RF and microwave engineering.

    • Written by the paradigm's creators and developers, based on their unique insights
    • Sets standard conventions and notation for use with X-parameters
    • Practical applications demonstrate how the theoretical principles of X-parameters can translate into real-world design and modelling benefits
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    Reviews & endorsements

    "This book is an excellent treatise by experts from Agilent on the assumption and use of x-parameters."
    Alfy Riddle, IEEE Microwave Magazine

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    Product details

    • format: Adobe eBook Reader
    • isbn: 9781107495869
    • contains: 154 b/w illus.
    • availability: This ISBN is for an eBook version which is distributed on our behalf by a third party.
  • Table of Contents

    1. S-parameters
    2. X-parameters
    3. Small-signal sensitivities in the X-parameters
    4. X-parameter measurements
    5. Multi-tone multi-port X-parameters
    6. Memory.

  • Authors

    David E. Root, Agilent Technologies
    David E. Root is an Agilent Research Fellow at Agilent Technologies. He co-led the Agilent research and technical development of X-parameters through its commercialization. He is a Fellow of the IEEE and co-editor of Nonlinear Transistor Model Parameter Extraction Techniques (2011).

    Jan Verspecht, Agilent Technologies
    Jan Verspecht is a Master Research Engineer at Agilent Technologies. He invented X-parameters in 1996 and is a Fellow of the IEEE.

    Jason Horn, Agilent Technologies
    Jason Horn is an Expert Design Engineer at Agilent Technologies and has been heavily involved in the development of X-parameter measurements.

    Mihai Marcu, Agilent Technologies
    Mihai Marcu is a Senior Consultant at Agilent Technologies, deeply involved in the development and application of X-parameters for non-linear modeling.

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