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An Introduction to X-ray Crystallography

An Introduction to X-ray Crystallography

2nd Edition

$92.00

  • Date Published: January 1997
  • availability: Available
  • format: Paperback
  • isbn: 9780521423595

$92.00
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About the Authors
  • A textbook for the senior undergraduate or graduate student beginning a serious study of X-ray crystallography. It will be of interest both to those intending to become professional crystallographers and to those physicists, chemists, biologists, geologists, metallurgists and others who will use it as a tool in their research. All major aspects of crystallography are covered--the geometry of crystals and their symmetry, theoretical and practical aspects of diffracting X-rays by crystals and how the data may be analyzed to find the symmetry of the crystal and its structure. Includes recent advances such as the synchrotron as a source of X-rays, methods of solving structures from power data and the full range of techniques for solving structures from single-crystal data. Computer programs are provided for carrying out many operations of data-processing and solving crystal structures including by direct methods. These programs are required for many of the examples given at the end of each chapter but can be used to create new examples by which students can test themselves or each other.

    • Completely up-to-date for second edition
    • A good balance of theoretical background and practical application
    • Provides computer programs listings (also available on the Internet), which illustrate most of the important operations of the subject including modern methods of solving structures
    • International reputation of the author
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    Product details

    • Edition: 2nd Edition
    • Date Published: January 1997
    • format: Paperback
    • isbn: 9780521423595
    • length: 416 pages
    • dimensions: 246 x 189 x 22 mm
    • weight: 0.74kg
    • contains: 252 b/w illus. 56 tables
    • availability: Available
  • Table of Contents

    Preface to the first edition
    Preface to the second edition
    1. The geometry of the crystalline state
    2. The scattering of X-rays
    3. Diffraction from a crystal
    4. The Fourier transform
    5. The experimental collection of diffraction data
    6. The factors affecting X-ray intensities
    7. The determination of space groups
    8. The determination of crystal structures
    9. Accuracy and refinement processes
    References
    Appendices
    Physical constants and tables
    Solutions to examples
    Bibliography
    Index.

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    These resources are provided free of charge by Cambridge University Press with permission of the author of the corresponding work, but are subject to copyright. You are permitted to view, print and download these resources for your own personal use only, provided any copyright lines on the resources are not removed or altered in any way. Any other use, including but not limited to distribution of the resources in modified form, or via electronic or other media, is strictly prohibited unless you have permission from the author of the corresponding work and provided you give appropriate acknowledgement of the source.

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  • Author

    Michael M. Woolfson, University of York

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