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Introduction to XAFS
A Practical Guide to X-ray Absorption Fine Structure Spectroscopy

$89.99

  • Date Published: February 2010
  • availability: In stock
  • format: Hardback
  • isbn: 9780521767750

$89.99
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  • X-ray absorption fine structure spectroscopy (XAFS) is a powerful and versatile technique for studying structures of materials in chemistry, physics, biology and other fields. This textbook is a comprehensive, practical guide to carrying out and interpreting XAFS experiments. Assuming only undergraduate-level physics and mathematics, the textbook is ideally suited for graduate students in physics and chemistry starting XAFS-based research. It contains concise executable example programs in Mathematica 7. Supplementary material available at www.cambridge.org/9780521767750 includes Mathematica code from the book, related Mathematica programs, and worked data analysis examples. The textbook addresses experiment, theory, and data analysis, but is not tied to specific data analysis programs or philosophies. This makes it accessible to a broad audience in the sciences, and a useful guide for researchers entering the subject.

    • Contains chapters on x-ray physics, synchrotron radiation instrumentation, and detectors
    • Includes concise executable example programs in Mathematica 7 to illustrate concepts and techniques
    • Mathematica code from the book, related Mathematica programs and worked data analysis examples are available online
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    Product details

    • Date Published: February 2010
    • format: Hardback
    • isbn: 9780521767750
    • length: 268 pages
    • dimensions: 254 x 178 x 16 mm
    • weight: 0.69kg
    • contains: 125 b/w illus.
    • availability: In stock
  • Table of Contents

    1. Introduction
    2. Basic physics of X-ray absorption and scattering
    3. Experimental
    4. Theory
    5. Data analysis
    6. Related techniques and conclusion
    References
    Appendices
    Index.

  • Author

    Grant Bunker, Illinois Institute of Technology
    Grant Bunker is Professor of Physics at the Illinois Institute of Technology. He has over 30 years experience in all aspects of XAFS spectroscopy, from technique development, instrumentation and computation, to applications in biology, chemistry and physics.

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