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Pattern Recognition and Neural Networks

Pattern Recognition and Neural Networks

$58.00

  • Date Published: January 2008
  • availability: Available
  • format: Paperback
  • isbn: 9780521717700

$58.00
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About the Authors
  • Ripley brings together two crucial ideas in pattern recognition: statistical methods and machine learning via neural networks. He brings unifying principles to the fore, and reviews the state of the subject. Ripley also includes many examples to illustrate real problems in pattern recognition and how to overcome them.

    • The most reliable account of the subject available - now in paperback
    • Unparalleled coverage with valuable insights into the theory and a wide range of applications
    • Real case-studies, data sets and examples help build skills and understanding
    Read more

    Reviews & endorsements

    "...an excellent text on the statistics of pattern classifiers and the application of neural network techniques...Ripley has managed...to produce an altogether accessible text...[it] will be rightly popular with newcomers to the area for its ability to present the mathematics of statistical pattern recognition and neural networks in an accessible format and engaging style." Nature

    "...a valuable reference for engineers and science researchers." Optics & Photonics News

    "The combination of theory and examples makes this a unique and interesting book." International Statistical Institute Journal

    See more reviews

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    Product details

    • Date Published: January 2008
    • format: Paperback
    • isbn: 9780521717700
    • length: 416 pages
    • dimensions: 246 x 189 x 22 mm
    • weight: 0.74kg
    • contains: 41 b/w illus.
    • availability: Available
  • Table of Contents

    1. Introduction and examples
    2. Statistical decision theory
    3. Linear discriminant analysis
    4. Flexible discriminants
    5. Feed-forward neural networks
    6. Non-parametric methods
    7. Tree-structured classifiers
    8. Belief networks
    9. Unsupervised methods
    10. Finding good pattern features
    Appendix: statistical sidelines
    Glossary
    References
    Author index
    Subject index.

  • general resources

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    These resources are provided free of charge by Cambridge University Press with permission of the author of the corresponding work, but are subject to copyright. You are permitted to view, print and download these resources for your own personal use only, provided any copyright lines on the resources are not removed or altered in any way. Any other use, including but not limited to distribution of the resources in modified form, or via electronic or other media, is strictly prohibited unless you have permission from the author of the corresponding work and provided you give appropriate acknowledgement of the source.

    If you are having problems accessing these resources please email cflack@cambridge.org

  • Author

    Brian D. Ripley, University of Oxford
    Brian Ripley is the Professor of Applied Statistics at the University of Oxford and a member of the Department of Statistics as well as a Professorial Fellow of St. Peter's College.

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