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Advanced Metallization Conference 2008 (AMC 2008)

Volume: 24
  • Edited by: M. Naik
  • Edited by: R. Shaviv
  • Edited by: T. Yoda
  • Edited by: K. Ueno
  • Hardback
  • ISBN:9781605111254
  • Publication date:April 2009
        • Dimensions: 235 x 158 mm
        • Weight: 1.15kg
          122.0097816051112540GB0en_USUSD$
        • (Z)

        The Advanced Metallization Conference - held in San Diego, California, and Tokyo, Japan - marked its 25th anniversary in 2008. These two sister conferences form a unique "one conference at two sites" that focuses on the latest R&D and manufacturing results, as well as real-world integration and reliability data on the application of metallization and related technologies for advanced IC devices. Scientists and engineers from around the world came to listen and present state-of-the-art work in the field of ULSI interconnect technology including metallization, dielectrics, integration, packaging, design and vertical integration. A keynote address by Gary Patton, vice president, IBM Systems and Technology Group, on 'Leading-edge Silicon Technology through Innovation and Collaboration', is featured. Additional topics include: integration; metallization; materials and characterization; CMP and cleaning; 3D integration and packaging; low-k materials; and reliability and yield.

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