Hostname: page-component-76fb5796d-x4r87 Total loading time: 0 Render date: 2024-04-25T20:57:10.497Z Has data issue: false hasContentIssue false

Simulating yield datasets: an opportunity to improve data filtering algorithms

Published online by Cambridge University Press:  01 June 2017

C. Leroux*
Affiliation:
SMAG, Montpellier, France UMR ITAP, Montpellier SupAgro, Irstea, France
H. Jones
Affiliation:
UMR ITAP, Montpellier SupAgro, Irstea, France
A. Clenet
Affiliation:
SMAG, Montpellier, France
B. Dreux
Affiliation:
DEFISOL, Evreux, France
M. Becu
Affiliation:
DEFISOL, Evreux, France
B. Tisseyre
Affiliation:
UMR ITAP, Montpellier SupAgro, Irstea, France
Get access

Abstract

Yield maps are a powerful tool with regard to managing upcoming crop productions but can contain a large amount of defective data that might result in misleading decisions. The objective of this work is to help improve and compare yield data filtering algorithms by generating simulated datasets as if they had been acquired directly in the field. Two stages were implemented during the simulation process (i) the creation of spatially correlated datasets and (ii) the addition of known yield sources of errors to these datasets. A previously published yield filtering algorithm was applied on these simulated datasets to demonstrate the applicability of the methodology. These simulated datasets allow results of yield data filtering methods to be compared and improved.

Type
Data analysis and Geostatistics
Copyright
© The Animal Consortium 2017 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Ben-Gal, I 2005. Outlier detection. Data Mining and Knowledge Discovery Handbook: A Complete Guide for Practitioners and Researchers, Kluwer Academic Publishers.Google Scholar
Bivand, RS, Pebesma, EJ and Gomez-Rubio, V 2008. Applied Spatial Data Analysis with R. Springer, New York, NY, USA.Google Scholar
Breunig, MM, Kriegel, H-P, Ng, RT and Sander, J 2000. Lof: identifying density-based local outliers. In Proceedings of 2000 ACM SIGMOD International Conference on Management of Data. ACM Press, pp. 93–104.Google Scholar
Drummond, ST, Fraisse, CW and Sudduth, KA 1999. Combine harvest area determination by vector processing of GPS position data. Transactions of ASAE 42 (5), 12211227.CrossRefGoogle Scholar
Griffin, T, Dobbins, C, Vyn, T, Florax, R and Lowenberg-DeBoer, J 2008. Spatial analysis of yield monitor data: case studies of on-farm trials and farm management decision making. Precision Agriculture 9 (5), 269283.Google Scholar
Lyle, G, Bryan, BA and Ostendorf, B 2013. Post-processing methods to eliminate erroneous grain yield measurements: review and directions for future development. Precision Agriculture 15 (4), 377402.Google Scholar
Molin, JP 2002. Methodology for identification , characterization and removal of errors on yield maps. ASAE Meeting Presentation 0300 (02), 17.Google Scholar
Robinson, TP and Metternicht, G 2005. Comparing the performance of techniques to improve the quality of yield maps. Agricultural Systems 85 (1), 1941.Google Scholar
Simbahan, CG, Dobermann, A and Ping, LJ 2004. Screening Yield Monitor Data Improves Grain Yield Maps. American Society of Agronomy 1102 (14303), 10911102.Google Scholar
Sudduth, KA and Drummond, ST 2007. Yield Editor: Software for Removing Errors from Crop Yield Maps. Agronomy Journal 99 (6), 1471.Google Scholar
Sudduth, KA, Drummond, ST, Myers, DB and Anatole, H 2012. Yield editor 2.0: Software for automated removal of yield map errors. In: Proceedings of the American Society of Agricultural and Biological Engineers International (ASABE).Google Scholar
Sun, W, Whelan, B, McBratney, AB and Minasny, B 2013. An integrated framework for software to provide yield data cleaning and estimation of an opportunity index for site-specific crop management. Precision Agriculture 14 (4), 376391.Google Scholar