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Role of Diffractometer Geometry in the Standardization of Polycrystalline Data

Published online by Cambridge University Press:  06 March 2019

William Parrish
William Parrish*
Affiliation:
IBM Research Laboratory, San Jose, California 95193
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Abstract

This paper reviews the factors in diffractometer geometry most likely to cause large errors in intensity measurements due to imperfect specimen preparation, particularly preferred orientation. It is recommended the same specimen be transferred to two or more diffractometer geometries in which the specimen has different orientations to obtain sets of complementary data. Three geometries are illustrated: θ-2θ scanning with reflection and transmission specimens, and Seeman-Bohlin with reflection specimen.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 17: Twenty-Second Annual Conference on Applications of X-ray Analysis, August 22-24, 1973 , 1973 , pp. 97 - 105
Copyright
Copyright © International Centre for Diffraction Data 1973

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References

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