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Structural and dielectric properties of Bi2NbxVi−xO5.5 ceramics

Published online by Cambridge University Press:  31 January 2011

K. B. R. Varma
Affiliation:
Materials Research Centre, Indian Institute of Science, Bangalore 560 012, India
K. V. R. Prasad
Affiliation:
Materials Research Centre, Indian Institute of Science, Bangalore 560 012, India
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Abstract

Bi2Nbx V1−xO5.5 ceramics with x ranging from 0.01 to 0.5 have been prepared. The crystal system transforms from an orthorhombic to tetragonal at x 3= 0.1 and it persists until x = 0.5. Scanning electron microscopic (SEM) investigations carried out on thermally etched Bi2NbxV1−xO5.5 ceramics confirm that the grain size decreases markedly (18 μm to 4 μm) with increasing x. The shift in the Curie temperature (725 K) toward lower temperatures, with increasing x, is established by Differential Scanning Calorimetry (DSC). The dielectric constants as well as the loss tangent (tan δ) decrease with increasing x at room temperature.

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Copyright
Copyright © Materials Research Society 1996

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References

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