Hostname: page-component-8448b6f56d-42gr6 Total loading time: 0 Render date: 2024-04-19T20:22:59.428Z Has data issue: false hasContentIssue false
  • English
  • Français

Island growth of Y2BaCuO5 nanoparticles in (211∼1.5 nm/123∼10 nm)×N composite multilayer structures to enhance flux pinning of YBa2Cu3O7−δ films

Published online by Cambridge University Press:  31 January 2011

T. Haugan ,
P.N. Barnes ,
I. Maartense ,
C.B. Cobb ,
E.J. Lee  and
M. Sumption
T. Haugan*
Affiliation:
Air Force Research Laboratory, Wright-Patterson Air Force Base, Ohio 45433-7919
P.N. Barnes
Affiliation:
Air Force Research Laboratory, Wright-Patterson Air Force Base, Ohio 45433-7919
I. Maartense
Affiliation:
Air Force Research Laboratory, Wright-Patterson Air Force Base, Ohio 45433-7919
C.B. Cobb
Affiliation:
Air Force Research Laboratory, Wright-Patterson Air Force Base, Ohio 45433-7919
E.J. Lee
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, Ohio 43210
M. Sumption
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, Ohio 43210
*
a)Address all correspondence to this author. e-mail: timothy.haugan@wpafb.af.mil
Get access

Abstract

A controlled introduction of second-phase Y2BaCuO5 (211) nanoparticles into YBa2Cu3O7−δ (123) thin films was achieved for the first time for the purpose of increasing flux pinning. The island-growth mode of 211 on 123 was utilized to obtain an area particle density >1011 cm-2 of 211 thick-disk-shaped nanoparticles in individual layers. Composite layered structures of (211y nanoparticles/123z)×N were deposited by pulsed laser deposition on LaAlO3 substrates, with N bilayers = 24 to 100, y thickness = 1 to 2 nm, and z thickness = 6 to 15 nm (assuming continuous layer coverage). With 211 addition, the critical current densities at 77 K were higher at magnetic fields as low as 0.1 T and increased as much as approximately 300% at 1.5 T. The superconducting transition temperature was reduced by approximately 2 to 4 K for 211 volume fraction <20%. Reinitiation of 123 growth after every 211 layer resulted in a smooth and flat surface finish on the films and also greatly reduced surface particulate formation especially in thicker films (∼ μm).

Type
Articles
Information
Journal of Materials Research , Volume 18 , Issue 11 , November 2003 , pp. 2618 - 2623
Copyright
Copyright © Materials Research Society 2003

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Bourdillon, A. and Bourdillon, N.X. Tan, High Temperature Superconductors: Processing and Science (Academic Press, San Diego CA, 1994).Google Scholar
2.Larbalestier, D., Gurevich, A., D. Matthew Feldmann, and Polyanskii, A., Nature 414, 368 (2001).CrossRefGoogle Scholar
3.Murakami, M., Shaw, D.T., and Jin, S., in Processing and Properties of High T c Superconductors Volume 1, Bulk Materials, edited by Jin, S. (World Scientific Publishing, River Edge, NJ, 1993).Google Scholar
4.Larbalestier, D.C. and Maley, M.P., Mater. Res. Bull. August (1993), p. 50.Google Scholar
5.Iijima, Y., Onabe, K., Tugaki, N., Tanabe, N., Sadakara, N., Kohno, O., and Ikeno, Y., Appl. Phys. Lett. 60, 769 (1992).CrossRefGoogle Scholar
6.Wu, X.D., Foltyn, S.R., Arendt, P.N., Blumenthal, W.R., Campbell, I.H., Cotton, J.D., Coulter, J.Y., Hults, W.L., Maley, M.P., Safar, H.F., and Smith, J.L., Appl. Phys. Lett. 67, 2397 (1995).CrossRefGoogle Scholar
7.Goyal, A., Norton, D.P., Budai, J.D., Paranthaman, M., Specht, E.D., Kroeger, D.M., Christen, D.K., He, Q., Saffian, B., List, F.A., Lee, D.F., Martin, P.M., Klabunde, C.E., Hartfield, E., and Sikka, V.K., Appl. Phys. Lett. 69, 1795 (1996).CrossRefGoogle Scholar
8.Foltyn, S.R., Peterson, E.J., Coulter, J.Y., Arendt, P.N., Jia, Q.X., Dowden, P.C., Maley, M.P., Wu, X.D., and Peterson, D.E., J. Mater. Res. 12, 2941 (1997).CrossRefGoogle Scholar
9.Aytug, T., Paranthaman, M., Sathyamurthy, S., Kang, B.W., Beach, D.B., Specht, E.D., Lee, D.F., Feenstra, R., Goyal, A., Kroeger, D.M., Leonard, K.J., Martin, P.M., and Christen, D.K., ORNL Superconducting Technology Program for Electric Power Systems, Annual Report for FY 2001, <http://www.ornl.gov/HTSC/htsc.html>..>Google Scholar
10.Takezawa, N. and Fukushima, K., Physica C 290, 31 (1997).CrossRefGoogle Scholar
11.Phase Diagrams for High T c Superconductors, edited by Whitler, J.D. and Roth, R.S. (American Ceramic Society, Westerville OH, 1991).Google Scholar
12.Skakle, J.M.S., Mater. Sci. Eng. R23, 1 (1998).CrossRefGoogle Scholar
13.Reichelt, K., Vacuum 38 (12), 1083 (1988).CrossRefGoogle Scholar
14.Pan, V.M., Kaminsky, G.G., Kasatkin, A.L., Kuznetsov, M.A., Prokhorov, V.G., Svetchnikov, V.L., Tretiatchenko, C.G., Flis, V.S., Yushchenko, S.K., Matsui, V.I., and Melnikov, V.S., Supercond. Sci. Technol. 5, S48 (1992).CrossRefGoogle Scholar
15.Murakami, M., Gotoh, S., Fujimoto, H., Yamaguchi, K., Koshizuka, N., and Tanaka, S., Supercond. Sci. Technol. 4, S43 (1991).CrossRefGoogle Scholar
16.Jin, S., Kamlott, G.W., Tiefel, T.H., Kodas, T., Ward, T.L., and Kroeger, D.M., Physica C 181, 57 (1992).CrossRefGoogle Scholar
17.Shi, D., Sengupta, S., Luo, J.S., Varanasi, C., and McGinn, P.J., Physica C 213, 179 (1993).CrossRefGoogle Scholar
18.Chopra, M., Chan, S.W., Meng, R.L., and Chu, C.W., J. Mater. Res. 11, 1616 (1996).CrossRefGoogle Scholar
19.Sengupta, S., Shi, D., Luo, J.S., Buzdin, A., Gorin, V., Todt, V.R., Varanasi, C., and McGinn, P.J., J. Appl. Phys. 81, 7396 (1997).CrossRefGoogle Scholar
20.Zhou, L., Chen, S.K., Wang, K.G., Wu, X.Z., Zhang, P.X., and Feng, Y., Physica C 363, 99 (2001).CrossRefGoogle Scholar
21.Haugan, T., Barnes, P., Nekkanti, R., Maartense, I., Brunke, L., and Murphy, J., in Extended Abstracts of the 2001 International Workshop on Superconductivity Co-Sponsored by ISTEC and MRS (ISTEC, Minato-ku, Japan, 2001), p. 111.Google Scholar
22.Haugan, T.J., Barnes, P.N., Nekkanti, R.M., Maartense, I., Brunke, L.B., and Murphy, J. in Materials for High-Temperature Superconductor Technologies, edited by Paranthaman, M.P., Rupich, M.W., Salama, K., Mannhart, J., and Hasegawa, T. (Mater. Res. Soc. Symp. Proc. 689, Warrendale, PA, 2002), pp. 217–221.Google Scholar
23.Ekin, J.W., Larson, T.M., Bergren, N.F., Nelson, A.J., Swartzlander, A.B., Kazmerski, L.L., Panson, A.J., and Blankenship, B.A., Appl. Phys. Lett. 52, 1819 (1988).CrossRefGoogle Scholar
24.Goodrich, L.F., Srivastava, A.N., Stauffer, T.C., Roshko, A., and Vale, L.R., IEEE Trans Appl. Supercond. 4, 61 (1994).CrossRefGoogle Scholar
25.Maartense, I., Sarkar, A.K., and Kozlowski, G., Physica C 181, 25 (1991).CrossRefGoogle Scholar
26.Sarkar, A., Kumar, B., Maartense, I., and Peterson, T.L., J. Appl. Phys. 65, 2392 (1989).CrossRefGoogle Scholar
27.Thompson, J.R., Krusin-Elbaum, L., Kim, Y.C., Christen, D.K., Marwick, A.D., Wheeler, R., Li, C., Patel, S., Shaw, D.T., Lisowski, P., and Ullmann, J., IEEE Trans. Appl. Supercond. 5, 1876 (1995).CrossRefGoogle Scholar
28.Thompson, J.R., Ossandon, J.G., Krusin-Elbaum, L., Kim, H.J., Song, K.J., Christen, D.K., and Ullmann, J.L., Physica C 378–381 (2002), p. 409.CrossRefGoogle Scholar
29.Jia, Q.X., Foltyn, S.R., Arendt, P.N., and Smith, J.F., Appl. Phys. Lett. 80, 1601 (2002).CrossRefGoogle Scholar