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Ultrafast electron relaxation measurements on α-SiO2 using high-order harmonics generation

  • H. MERDJI (a1), S. GUIZARD (a2), P. MARTIN (a2), G. PETITE (a2), F. QUÉRÉ (a2), B. CARRÉ (a1), J.F. HERGOTT (a1), L. LE DÉROFF (a1), P. SALIÈRES (a1), O. GOBERT (a1), P. MEYNADIER (a1) and M. PERDRIX (a1)
  • Published online: 01 April 2001

Time-resolved photoemission spectroscopy, using high order harmonics, is used to measure the energy relaxation rate of hot electrons in α-SiO2 with sub-picosecond time resolution. Our results indicate that electrons of 30 eV kinetic energy in the conduction band relax at a rate which is at least two orders of magnitude lower than the one of photo-excited carriers of a few eV. As a result, we give insight in the relaxation process of hot electrons and show that impact ionization probability per unit time is only of the order of 1/40 ps−1, in very strong contrast with the much higher value generally assumed in models of optical breakdown.

Corresponding author
Address correspondence and reprint requests to: H. Merdji, CEA, Service des Photons, Atomes et Molecules, Bat. 524, Centre d'Etudes de Saclay, 91191 Gif-sur-Yvette Cedex, France. E-mail:
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Laser and Particle Beams
  • ISSN: 0263-0346
  • EISSN: 1469-803X
  • URL: /core/journals/laser-and-particle-beams
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