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Aberration correction: Some Advantages and Alternatives

  • R. E. Dunin-Borkowski (a1), T. Kasama (a2), L. Cervera (a1), A. C. Twitchett (a1), P. A. Midgley (a1), A. C. Robins (a3), D. W. Smith (a3), J. J. Gronsky (a3), C. M. Thomas (a3), P. E. Fischione (a3), C. J. D. Hetherington (a4) and A. I. Kirkland (a4)...
Extract

Extended abstract of a paper presented at the Pre-Meeting Congress: Materials Research in an Aberration-Free Environment, at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, July 31 and August 1, 2004.

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© 2004 Microscopy Society of America
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Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
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