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Advances in Atomic-resolution and Molecular-detection EELS

Published online by Cambridge University Press:  04 August 2017

Ondrej L. Krivanek ,
Niklas Dellby ,
Tracy C. Lovejoy ,
Ray F. Egerton  and
Peter Rez
Ondrej L. Krivanek
Affiliation:
Nion R&D, Kirkland, WA, USA Department of Physics, Arizona State U., Tempe, AZ, USA
Niklas Dellby
Affiliation:
Nion R&D, Kirkland, WA, USA
Tracy C. Lovejoy
Affiliation:
Nion R&D, Kirkland, WA, USA
Ray F. Egerton
Affiliation:
Department of Physics, University of Alberta, Edmonton, Canada
Peter Rez
Affiliation:
Department of Physics, Arizona State U., Tempe, AZ, USA

Abstract

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Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1028 - 1029
Copyright
© Microscopy Society of America 2017 

References

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