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Advantages of Helium and Neon Ion Beams for Intelligent Imaging

Published online by Cambridge University Press:  27 August 2014

Huimeng Wu ,
Shawn Mcvey ,
David Ferranti ,
Chuong Huynh ,
John Notte ,
Lewis Stern ,
Matthew S. Joens ,
James A. J Fitzpatrick  and
Bernhard Goetze
Huimeng Wu
Affiliation:
Ion Microscopy Innovation Center, Carl Zeiss Microscopy LLC, One Corporation Way, Peabody MA 01960, USA
Shawn Mcvey
Affiliation:
Ion Microscopy Innovation Center, Carl Zeiss Microscopy LLC, One Corporation Way, Peabody MA 01960, USA
David Ferranti
Affiliation:
Ion Microscopy Innovation Center, Carl Zeiss Microscopy LLC, One Corporation Way, Peabody MA 01960, USA
Chuong Huynh
Affiliation:
Ion Microscopy Innovation Center, Carl Zeiss Microscopy LLC, One Corporation Way, Peabody MA 01960, USA
John Notte
Affiliation:
Ion Microscopy Innovation Center, Carl Zeiss Microscopy LLC, One Corporation Way, Peabody MA 01960, USA
Lewis Stern
Affiliation:
Ion Microscopy Innovation Center, Carl Zeiss Microscopy LLC, One Corporation Way, Peabody MA 01960, USA
Matthew S. Joens
Affiliation:
Waitt Advanced Biophotonics Center, Salk Institute for Biological Studies, 10010 North Torrey Pines Road, La Jolla, CA 92037, USA
James A. J Fitzpatrick
Affiliation:
Waitt Advanced Biophotonics Center, Salk Institute for Biological Studies, 10010 North Torrey Pines Road, La Jolla, CA 92037, USA
Bernhard Goetze
Affiliation:
Ion Microscopy Innovation Center, Carl Zeiss Microscopy LLC, One Corporation Way, Peabody MA 01960, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 338 - 339
Copyright
Copyright © Microscopy Society of America 2014 

References

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[5] Joens, MS, Huynh, C, Kasuboski, JM, et al Nature Scientific Reports 3(3514) (2013), p. 1.Google Scholar