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An Assessment of Polarized Light Microscopy for the Quantification of Grain Size and Orientation in Titanium Alloys via Microanalytical Correlative Light to Electron Microscopy (CLEM)

  • Hamed Safaie (a1), Ria L. Mitchell (a1), Richard Johnston (a1), James Russell (a1) and Cameron Pleydell-Pearce (a1)...
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      An Assessment of Polarized Light Microscopy for the Quantification of Grain Size and Orientation in Titanium Alloys via Microanalytical Correlative Light to Electron Microscopy (CLEM)
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      An Assessment of Polarized Light Microscopy for the Quantification of Grain Size and Orientation in Titanium Alloys via Microanalytical Correlative Light to Electron Microscopy (CLEM)
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[1] Bache, M.R. International Journal of Fatigue 25 2003) p. 1079.
[2] Germain, L., et al, Materials Science and Engineering A319-321 2001) p. 409.
[3] Ross, S., et al, Journal of microscopy 178(Pt.1 1997) p. 62.
[4] Massoumian, F, et al, Journal of Microscopy 209(Pt.1 2003) p. 13.
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Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
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