Hostname: page-component-8448b6f56d-c4f8m Total loading time: 0 Render date: 2024-04-23T21:09:51.086Z Has data issue: false hasContentIssue false
  • English
  • Français

Analyzing Dislocations with Virtual Dark Field Images Reconstructed from Electron Diffraction Patterns

Published online by Cambridge University Press:  27 August 2014

E.F. Rauch  and
M. Véron
E.F. Rauch
Affiliation:
SIMAP Laboratory, CNRS-Grenoble INP, BP 46 101 rue de la Physique, 38402 Saint Martin d’Hères, France
M. Véron
Affiliation:
SIMAP Laboratory, CNRS-Grenoble INP, BP 46 101 rue de la Physique, 38402 Saint Martin d’Hères, France

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1456 - 1457
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Rauch, E.F.and Veron, M J. Mater. Sci. Eng. Tech. 36 (2005) 552–556.Google Scholar
[2] Rauch, E.F., Portillo, J., Nicolopoulos, S., Bultreys, D., Rouvimov, S., Moeck, P Zeitschrift für Kristallographie (2010) Vol. 225, issue 2-3 pp. 103-109.Google Scholar