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Application of Atom Probe Tomography to Complex Microstructures of Laser Additively Manufactured Samples

Published online by Cambridge University Press:  05 August 2019

Philipp Kürnsteiner*
Affiliation:
Max-Planck-Institut für Eisenforschung GmbH, Düsseldorf 40237, Germany
Avinash Hariharan
Affiliation:
Max-Planck-Institut für Eisenforschung GmbH, Düsseldorf 40237, Germany
Hyo Yun Jung
Affiliation:
Max-Planck-Institut für Eisenforschung GmbH, Düsseldorf 40237, Germany
Nicolas Peter
Affiliation:
Max-Planck-Institut für Eisenforschung GmbH, Düsseldorf 40237, Germany
Markus Benjamin Wilms
Affiliation:
Fraunhofer Institute for Laser Technology ILT, Aachen 52074, Germany
Andreas Weisheit
Affiliation:
Fraunhofer Institute for Laser Technology ILT, Aachen 52074, Germany
Pere Barriobero-Vila
Affiliation:
German Aerospace Center (DLR), 51147 Cologne, Germany
Baptiste Gault
Affiliation:
Max-Planck-Institut für Eisenforschung GmbH, Düsseldorf 40237, Germany
Dierk Raabe
Affiliation:
Max-Planck-Institut für Eisenforschung GmbH, Düsseldorf 40237, Germany
Eric Aimé Jägle
Affiliation:
Max-Planck-Institut für Eisenforschung GmbH, Düsseldorf 40237, Germany
*
*Corresponding author: p.kuernsteiner@mpie.de
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Abstract

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Type
New Frontiers in Atom Probe Tomography Applications
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Kürnsteiner, P. et al. , Acta Mater. 129 (2017), 52-60.CrossRefGoogle Scholar
[2]Gault, B. et al. , J. Mater. Res. 33 (2018), 4018-4030.CrossRefGoogle Scholar
[3]Zhou, R. et al. , Intermetallics 94 (2018), 165171.CrossRefGoogle Scholar
[4]Rappaz, M., Jacot, A. and Boettinger, W.J., Mater. Trans. A. 34 (2003), 467479.CrossRefGoogle Scholar
[5]This work was funded by the MPG and FhG through the AProLAM project, the DFG through the PaCCman-Project (SPP 2006) and IMPRS-Surmat. The authors are grateful to Uwe Tezins and Andreas Sturm for their support to the FIB and APT facilities at MPIE.Google Scholar
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Application of Atom Probe Tomography to Complex Microstructures of Laser Additively Manufactured Samples
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