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Applications of Aberration Corrected TEM and Exit Wavefunction Reconstruction to Materials Science

Published online by Cambridge University Press:  27 August 2014

Angus Kirkland ,
Judy Kim ,
Jamie Warner ,
Konstantin Borisenko ,
Sarah Haigh ,
Neil Young ,
Peng Wang  and
Peter Nellist
Angus Kirkland
Affiliation:
University of Oxford, Department of Materials, Parks Road, Oxford OX13PH, UK
Judy Kim
Affiliation:
University of Oxford, Department of Materials, Parks Road, Oxford OX13PH, UK
Jamie Warner
Affiliation:
University of Oxford, Department of Materials, Parks Road, Oxford OX13PH, UK
Konstantin Borisenko
Affiliation:
University of Oxford, Department of Materials, Parks Road, Oxford OX13PH, UK
Sarah Haigh
Affiliation:
School of Materials, The University of Manchester, Manchester M13 9PL, UK
Neil Young
Affiliation:
University of Oxford, Department of Materials, Parks Road, Oxford OX13PH, UK
Peng Wang
Affiliation:
National Laboratory of Solid State Microstructures and College of Engineering and Applied sciences, Nanjing University, Nanjing 210093, People’sRepublic of China
Peter Nellist
Affiliation:
University of Oxford, Department of Materials, Parks Road, Oxford OX13PH, UK

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 930 - 931
Copyright
Copyright © Microscopy Society of America 2014 

References

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[8] Financial support from EPSRC (EP/F048009/1) and (EP/K032518/1) is gratefully acknowledged.Google Scholar