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Jain, Divya Isheim, Dieter Hunter, Allen H. and Seidman, David N. 2016. Multicomponent High-Strength Low-Alloy Steel Precipitation-Strengthened by Sub-nanometric Cu Precipitates and M2C Carbides. Metallurgical and Materials Transactions A, Vol. 47, Issue. 8, p. 3860.
Lefebvre-Ulrikson, W. Da Costa, G. Rigutti, L. and Blum, I. 2016. Atom Probe Tomography.
Marceau, R. K. W. 2016. Atomic-scale analysis of light alloys using atom probe tomography. Materials Science and Technology, Vol. 32, Issue. 3, p. 209.
Sauza, Daniel J. Bocchini, Peter J. Dunand, David C. and Seidman, David N. 2016. Influence of ruthenium on microstructural evolution in a model CoAlW superalloy. Acta Materialia, Vol. 117, p. 135.
Shimizu, Yasuo Takamizawa, Hisashi Inoue, Koji Yano, Fumiko Kudo, Shuichi Nishida, Akio Toyama, Takeshi and Nagai, Yasuyoshi 2016. Impact of carbon co-implantation on boron distribution and activation in silicon studied by atom probe tomography and spreading resistance measurements. Japanese Journal of Applied Physics, Vol. 55, Issue. 2, p. 026501.
Singh, Sudhanshu S. Loza, Jose J. Merkle, Arno P. and Chawla, Nikhilesh 2016. Three dimensional microstructural characterization of nanoscale precipitates in AA7075-T651 by focused ion beam (FIB) tomography. Materials Characterization, Vol. 118, p. 102.
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Boutard, J.-L. Badjeck, V. Barguet, L. Barouh, C. Bhattacharya, A. Colignon, Y. Hatzoglou, C. Loyer-Prost, M. Rouffié, A.L. Sallez, N. Salmon-Legagneur, H. and Schuler, T. 2014. Oxide dispersion strengthened ferritic steels: a basic research joint program in France. Journal of Nuclear Materials, Vol. 455, Issue. 1-3, p. 605.
Chen, Yimeng Chou, Peter H. and Marquis, Emmanuelle A. 2014. Quantitative atom probe tomography characterization of microstructures in a proton irradiated 304 stainless steel. Journal of Nuclear Materials, Vol. 451, Issue. 1-3, p. 130.
Gnaser, Hubert 2014. Atom probe tomography of nanostructures. Surface and Interface Analysis, Vol. 46, Issue. S1, p. 383.
Gnaser, Hubert Gutsch, Sebastian Wahl, Michael Schiller, Rüdiger Kopnarski, Michael Hiller, Daniel and Zacharias, Margit 2014. Phosphorus doping of Si nanocrystals embedded in silicon oxynitride determined by atom probe tomography. Journal of Applied Physics, Vol. 115, Issue. 3, p. 034304.
Kirchhofer, Rita Diercks, David R. Gorman, Brian P. Ihlefeld, Jon F. Kotula, Paul G. Shelton, Christopher T. Brennecka, Geoff L. and Green, D. J. 2014. Quantifying Compositional Homogeneity in Pb(Zr,Ti)O3Using Atom Probe Tomography. Journal of the American Ceramic Society, Vol. 97, Issue. 9, p. 2677.
Atom probe tomography is a technique for the nanoscale characterization of microstructural features. Analytical techniques have been developed to estimate the size, composition, and other parameters of features as small as 1 nm from the atom probe tomography data. These methods are outlined and illustrated with examples of yttrium-, titanium-, and oxygen-enriched particles in a mechanically alloyed, oxide-dispersion-strengthened steel.
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