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Atom Probe Tomography Characterization of Engineered Oxide Multilayered Structures

Published online by Cambridge University Press:  23 September 2015

M. I. Nandasiri ,
N. Madaan ,
A. Devaraj ,
J. Bao ,
Z. Xu ,
T. Varga ,
V. Shutthanandan  and
S. Thevuthasan
M. I. Nandasiri
Affiliation:
Environmental and Molecular Sciences Laboratory, Pacific Northwest National Laboratory, Richland WA, 99354
N. Madaan
Affiliation:
Environmental and Molecular Sciences Laboratory, Pacific Northwest National Laboratory, Richland WA, 99354
A. Devaraj
Affiliation:
Environmental and Molecular Sciences Laboratory, Pacific Northwest National Laboratory, Richland WA, 99354
J. Bao
Affiliation:
Computational Material Sciences, Pacific Northwest National Laboratory, Richland WA, 99354
Z. Xu
Affiliation:
Computational Material Sciences, Pacific Northwest National Laboratory, Richland WA, 99354
T. Varga
Affiliation:
Environmental and Molecular Sciences Laboratory, Pacific Northwest National Laboratory, Richland WA, 99354
V. Shutthanandan
Affiliation:
Environmental and Molecular Sciences Laboratory, Pacific Northwest National Laboratory, Richland WA, 99354
S. Thevuthasan
Affiliation:
Qatar Environment and Energy Research Institute, Qatar Foundation, Doha, Qatar

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 845 - 846
Copyright
Copyright © Microscopy Society of America 2015 

References

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