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Atomic Force Microscopy of Polymer Systems: From Morphology to Properties to Chemical Imaging and Spectroscopy

Published online by Cambridge University Press:  25 July 2016

Gregory F. Meyers
Gregory F. Meyers*
Affiliation:
Core R&D–Analytical Sciences, The Dow Chemical Company, Midland, MI USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 354 - 355
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Meyer, E., Josef Hug, H & Bennewitz, R. “Scanning Probe Microscopy: The Lab on a Tip”, 1st Edition , (Springer-Verlag, Berlin Heidelberg) (2004).CrossRefGoogle Scholar
[2] Meyers, G., DeKoven, B. & Seitz, J. Langmuir 8(9 (1992) 2330–2335.CrossRefGoogle Scholar
[3] Meyers, G., DeKoven, B., Dineen, M., Strandjord, A., O’Connor, P., Hu, T., Chiao, Y.-H., Pollock, H. & Hammiche, A. ACS Symposium Series 741(Microstructure and Microtribology of Polymer Surfaces) (2000), 190-211.CrossRefGoogle Scholar
[4] VanLandingham, M., Villarrubia, J., Guthrie, W. & Meyers, G. Macromolecular Symposia 167(Recent Advances in Scanning Probe Microscopy of Polymers) (2001) 15–43.Google Scholar
[5] Belikov, S., Erina, N., Huang, L., Su, C., Prater, C., Magonov, S., Ginzburg, V., McIntyre, B., Lakrout, H. & Meyers, G. Journal of Vacuum Science & Technology B 27(2 (2009) 984–992.CrossRefGoogle Scholar
[6] Su, C. Microscopy and Microanalysis 16(Suppl. 2 (2010) 364–365.CrossRefGoogle Scholar
[7] Meyers, G., Dineen, M., Shaffer, E., Stokich, T. & Im, J.-H. Macromolecular Symposia 167(Recent Advances in Scanning Probe Microscopy of Polymers) (2001) 213–226.Google Scholar
[8] Meyers, G., Pastzor, A. Jr. & Kjoller, K. American Laboratory (Shelton, CT, USA) 39(20 (2007) 9–14.Google Scholar
[9] Dazzi, A., Prazeres, R., Glotin, F. & Ortega, J. Optics Letters 30(18 (2005) 2388–2390.CrossRefGoogle Scholar
[10] Meyers, G., Reinhardt, C., Felts, J., King, W., Prater, C., Cook, D. & Kjoller, K. 68th Annual Technical Conference - Society of Plastics Engineers (2010), 801-805.Google Scholar
[11] Dazzi, A., Prater, C., Hu, Q., Chase, B., Rabolt, J. & Marcott, C. Applied Spectroscopy 66(12 (2012) 1365–1384.CrossRefGoogle Scholar