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Atomic Imaging and Spectroscopy of Two-Dimensional Materials

  • Juan Carlos Idrobo (a1), Wu Zhou (a2), Myron Kapetanakis (a2) (a3), Micah P. Prange (a4), Leonardo Basile (a1) (a5), Sokrates T. Pantelides (a2) (a3) and Stephen J. Pennycook (a6)...
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Abstract

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References

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[1]Feynman, R.P. “There is plenty of room at the bottom” (1959).
[2]Krivanek, O.L., et al., Nature 464 (2010), 571.
[3]Varela, M., et al., Phys. Rev. Lett. 92 (2004), 095502.
[4]Suenaga, K., Koshino, M. Nature 468 (2010). 1088.
[5]Zhou, W., et al., Phys. Rev. Lett. 109 (2012). 206803.
[6]Ramasse, Q., et al., Nano Letters 13 (2013), 4989.
[7]Krivanek, O.L., et al., Ultramicroscopy 108 (2008) 179.
[8] This research was supported by the Center for Nanophase Materials Sciences (CNMS), which is sponsored at ORNL by the Scientific User Facilities Division, Office of Basic Energy Sciences, U.S. DOE (JCI),by a Wigner Fellowship through the Laboratory Directed Research and Development Program of Oak Ridge National Laboratory (ORNL), managed by UT-Battelle, LLC, for the U.S. DOE (WZ), the National Secretariat of Higher Education, Science, Technology and Innovation of Ecuador (SENESCYT) (LB), and by the Office of Basic Energy Sciences, Materials Sciences and Engineering Division, U.S. DOE (STP, SJP), and DOE Grant No. DE-FG02-09ER46554 (MDK, MPP, STP). This research used resources of the National Energy Research Scientific Computing Center, which is supported by the Office of Science of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231.
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Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
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