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Atomic-resolution Imaging Using Cs-corrected Vortex Beams

Published online by Cambridge University Press:  27 August 2014

Peter Ercius ,
Tyler Harvey ,
Jordan Pierce ,
Jordan Chess ,
Martin Linck  and
Ben McMorran
Peter Ercius
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley, CA
Tyler Harvey
Affiliation:
Department of Physics, 1274 University of Oregon, Eugene OR
Jordan Pierce
Affiliation:
Department of Physics, 1274 University of Oregon, Eugene OR
Jordan Chess
Affiliation:
Department of Physics, 1274 University of Oregon, Eugene OR
Martin Linck
Affiliation:
Corrected Electron Optical Systems GmbH, Englerstr. 28, D-69126 Heidelberg, Germany
Ben McMorran
Affiliation:
Department of Physics, 1274 University of Oregon, Eugene OR

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 84 - 85
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Verbeeck, J, Tian, H and Schattschneider, P Nature, 467 (2010), p. 301 - 304.Google Scholar
[2] McMorran, B, et al, Science 331 (2011), p. 192 - 195.Google Scholar
[3] NCEM is supported by the U.S. Department of Energy under contract no. DE-AC02-05CH11231.Google Scholar